Datasheet > EB51F5G30DV-10.000M

EB51F5G30DV-10.000M

更新时间： 2024-01-23 19:45:20

品牌	Logo	应用领域
日蚀 - ECLIPTEK		/
页数	文件大小	规格书
4页	117K
描述
OSCILLATORS 3.0PPM -30+75 5.0V 4 10.000MHZ CMOS 10% FULL 14PIN DIP

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EB51F5G30DV-10.000M 技术参数

是否无铅：	含铅	是否Rohs认证：	不符合
生命周期：	Active	Reach Compliance Code：	unknown
风险等级：	5.79	Is Samacsys：	N
Base Number Matches：	1

EB51F5G30DV-10.000M 数据手册

浏览型号EB51F5G30DV-10.000M的Datasheet PDF文件第2页

EB51F5G30DV-10.000M

EB51F5 G 30 D V -10.000M

Series

Nominal Frequency

5.0Vdc 14-Pin DIP HCMOS TCXO

10.000MHz

Initial Tolerance

±1.0ppm Maximum

Control Voltage

2.5Vdc ±2.0Vdc

Frequency Stability

±3.0ppm Maximum

Operating Temperature Range

-30°C to +75°C

ELECTRICAL SPECIFICATIONS

Nominal Frequency

10.000MHz

Initial Tolerance

±1.0ppm Maximum (Measured at Nominal Vdd and Vc)

±3.0ppm Maximum

Frequency Stability

Frequency Stability vs. Input Voltage ±0.3ppm Maximum (Vdd ±5%)

Frequency Stability vs. Aging

Frequency Stability vs. Load

Operating Temperature Range

Supply Voltage

±1ppm/Year Maximum (at 25°C)

±0.2ppm Maximum (±10%)

-30°C to +75°C

5.0Vdc ±5%

Input Current

15mA Maximum (Measured at Steady State at 25°C)

Output Voltage Logic High (Voh)

Output Voltage Logic Low (Vol)

Rise/Fall Time

Vdd-0.5Vdc Minimum

0.5Vdc Maximum

6nSec Maximum (Measured at 20% to 80% of waveform)

Duty Cycle

50% ±5% (Measured at 50% of waveform)

Load Drive Capability

Output Logic Type

Control Voltage

30pF HCMOS Load Maximum

CMOS

2.5Vdc ±2.0Vdc

Control Voltage Range

Frequency Deviation

Linearity

0.0Vdc to Vdd

±7ppm Minimum, ±20ppm Maximum (Referenced to Fo at Vc=2.5Vdc; Vdd=5.0Vdc)

±10% Maximum

Internal Trim

±3ppm Minimum (at 25°C, Top Access)

10kOhms Typical

Input Impedance

Phase Noise

-70dBc/Hz at 10Hz Offset, -100dBc/Hz at 100Hz Offset, -130dBc/Hz at 1kHz Offset, -140dBc/Hz at 10kHz

Offset, -145dBc/Hz at 100kHz Offset (Typical Values at 19.440MHz)

Storage Temperature Range

-55°C to +125°C

ENVIRONMENTAL & MECHANICAL SPECIFICATIONS

Fine Leak Test

MIL-STD-883, Method 1014 Condition A (Internal Crystal Only)

Gross Leak Test

Lead Integrity

MIL-STD-883, Method 1014 Condition C (Internal Crystal Only)

MIL-STD-883, Method 2004

Mechanical Shock

Resistance to Soldering Heat

Resistance to Solvents

Solderability

MIL-STD-202, Method 213 Condition C

MIL-STD-202, Method 210

MIL-STD-202, Method 215

MIL-STD-883, Method 2003

Temperature Cycling

Vibration

MIL-STD-883, Method 1010

MIL-STD-883, Method 2007 Condition A

www.ecliptek.com | Specification Subject to Change Without Notice | Rev A 2/16/2010 | Page 1 of 4

12 3 4

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