DS2172T

更新时间： 2024-02-25 13:45:28

品牌	Logo	应用领域
达拉斯 - DALLAS		测试
页数	文件大小	规格书
21页	215K
描述
Bit Error Rate Tester BERT

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技术参数
数据手册

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DS2172T 技术参数

是否无铅：	不含铅	是否Rohs认证：	符合
生命周期：	Obsolete	零件包装代码：	QFP
包装说明：	TQFP,	针数：	32
Reach Compliance Code：	compliant	HTS代码：	8542.39.00.01
风险等级：	5.61	JESD-30 代码：	S-PQFP-G32
JESD-609代码：	e3	长度：	7 mm
湿度敏感等级：	1	功能数量：	1
端子数量：	32	最高工作温度：	85 °C
最低工作温度：	-40 °C	封装主体材料：	PLASTIC/EPOXY
封装代码：	TQFP	封装形状：	SQUARE
封装形式：	FLATPACK, THIN PROFILE	峰值回流温度（摄氏度）：	260
认证状态：	Not Qualified	座面最大高度：	1.2 mm
标称供电电压：	5 V	表面贴装：	YES
电信集成电路类型：	TELECOM CIRCUIT	温度等级：	INDUSTRIAL
端子面层：	MATTE TIN	端子形式：	GULL WING
端子节距：	0.8 mm	端子位置：	QUAD
处于峰值回流温度下的最长时间：	NOT SPECIFIED	宽度：	7 mm
Base Number Matches：	1

DS2172T 数据手册

DS2172

Bit Error Rate Tester (BERT)

www.dalsemi.com

FEATURES

PIN ASSIGNMENT

ꢀ Generates/Detects digital bit patterns for

analyzing, evaluating and troubleshooting

digital communications systems

ꢀ Operates at speeds from DC to 52 MHz

ꢀ Programmable polynomial length and

feedback taps for generation of any other

pseudorandom pattern up to 32 bits in length

including: 2⁶-1, 2⁹-1, 2¹¹-1, 2¹⁵-1, 2²⁰-1, 2²³-1,

and 2³²-1

32 31 30 29 28 27 26 25

AD0

AD1

TEST

VSS

AD2

AD3

AD4

RLOS

VSS

VDD

INT

WR(R/W)

ALE(AS)

DS2172

32-Pin TQFP 20

ꢀ Programmable user-defined pattern and

length for generation of any repetitive pattern

up to 32 bits in length

9 10 11 12 13 14 15 16

ꢀ Large 32-bit error count and bit count

registers

ꢀ Software programmable bit error insertion

ꢀ Fully independent transmit and receive

sections

ORDERING INFORMATION

ꢀ 8-bit parallel control port

DS2172T

(0⁰C to 70⁰C)

ꢀ Detects test patterns with bit error rates up to

DS2172TN

(-40⁰C to + 85⁰C)

10^-2

DESCRIPTION

The DS2172 Bit Error Rate Tester (BERT) is a software programmable test pattern generator, receiver,

and analyzer capable of meeting the most stringent error performance requirements of digital

transmission facilities. Two categories of test pattern generation (Pseudo-random and Repetitive)

conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS2172 operates at clock rates

ranging from DC to 52 MHz. This wide range of operating frequency allows the DS2172 to be used in

existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs,

Routers, Bridges, CSUs, DSUs, and CPE equipment.

The DS2172 user-programmable pattern registers provide the unique ability to generate loopback patterns

required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence the DS2172 can initiate the

loopback, run the test, check for errors, and finally deactivate the loopback.

The DS2172 consists of four functional blocks: the pattern generator, pattern detector, error counter, and

control interface. The DS2172 can be programmed to generate any pseudorandom pattern with length up

to 2³²-1 bits (see Table 5, Note 9) or any user programmable bit pattern from 1 to 32 bits in length. Logic

inputs can be used to configure the DS2172 for applications requiring gap clocking such as Fractional-T1,

Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the

DS2172 can insert single or 10^-1to 10^-7bit errors to verify equipment operation and connectivity.

1 of 21

051700

12 3 4 5 6 7...21

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与DS2172T相关器件

型号	品牌	描述	获取价格	数据表
DS2172T/T&R	MAXIM	Telecom Circuit, 1-Func, PQFP32, TQFP-32	获取价格
DS2172T/T&R+	MAXIM	Telecom Circuit, 1-Func, PQFP32, TQFP-32	获取价格
DS2172T+	MAXIM	Telecom Circuit, 1-Func, PQFP32, TQFP-32	获取价格
DS2172T+T&R	MAXIM	Telecom Circuit, 1-Func, PQFP32, TQFP-32	获取价格
DS2172TN	DALLAS	Bit Error Rate Tester BERT	获取价格
DS2172TN+	MAXIM	Telecom Circuit, 1-Func, PQFP32, TQFP-32	获取价格

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