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DP83TC811R-Q1 PDF预览

DP83TC811R-Q1

更新时间: 2023-09-03 20:28:40
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德州仪器 - TI 以太网
页数 文件大小 规格书
128页 1829K
描述
低功耗 100BASE-T1 汽车 PHYTER™ 以太网物理层收发器

DP83TC811R-Q1 数据手册

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DP83TC811R-Q1  
www.ti.com.cn  
ZHCSHX5A NOVEMBER 2017REVISED MARCH 2018  
Pin Functions(1) (continued)  
PIN  
STATE(2)  
DESCRIPTION  
NAME  
NO.  
SERIAL MANAGEMENT INTERFACE  
Management Data Clock: Synchronous clock to the MDIO serial management input and output  
data. This clock may be asynchronous to the MAC transmit and receive clocks. The maximum clock  
rate is 25 MHz. There is no minimum clock rate.  
MDC  
1
I
Management Data Input/Output: Bidirectional management data signal that may be sourced by the  
management station or the PHY. This pin requires a pullup resistor.  
MDIO  
36  
IO  
Recommended to use a resistor between 2.2 kΩ and 9 kΩ.  
CONTROL INTERFACE  
Interrupt: Active-LOW output, which will be asserted LOW when an interrupt condition occurs. This  
pin has a weak internal pullup. Register access is necessary to enable various interrupt triggers.  
Once an interrupt event flag is set, register access is required to clear the interrupt event.  
INT  
2
PU, OD, O  
Note: Power-on-RESET (POR) Done interrupt is enabled by default. POR Done interrupt can be  
cleared by reading register INT_STAT3 Register 0x0018 – Interrupt Status Register #3.  
This pin can be configured as an Active-HIGH output using register INT_TEST Register 0x0011 –  
Interrupt Test Register.  
Reset: Active-LOW input, which initializes or reinitializes the DP83TC811R-Q1. Asserting this pin  
LOW for at least 1 μs will force a reset process to occur. All internal registers will reinitialize to their  
default states as specified for each bit in the Register Maps section. All bootstrap pins are resampled  
upon deassertion of reset.  
RESET  
EN  
3
7
PU, I  
PD, I  
Enable: Active-HIGH input, which will disable the DP83TC811R-Q1 when pulled LOW and power  
down all internal blocks. Disable state is equivalent to a power-down state.  
This pin can be directly tied to VDDIO; enabling the device.  
WAKE: Active-HIGH input, which wakes the PHY from SLEEP. Asserting this pin HIGH at power-up  
will prevent the PHY from going to SLEEP.  
WAKE  
INH  
8
PD, I  
O
This pin can be directly tied to VDDIO to wake the device.  
INH: Active-HIGH output, which will be asserted HIGH when the PHY is in SLEEP or DISABLED.  
This pin is LOW for all other PHY states.  
10  
CLOCK INTERFACE  
Reference Clock Input (MII and RGMII): Reference clock 25-MHz ±100 ppm-tolerance crystal or  
oscillator input. The device supports either an external crystal resonator connected across pins XI  
and XO, or an external CMOS-level oscillator connected to pin XI only and XO left floating.  
Reference Clock Input (RMII): Reference clock 50-MHz ±100 ppm-tolerance CMOS-level oscillator  
in RMII Slave mode. Reference clock 25-MHz ±100 ppm-tolerance crystal or oscillator in RMII Master  
mode.  
XI  
5
4
I
This is a fail-safe pin. When the PHY is not powered, an external oscillator is allowed to be powered  
and driving into this pin. Fail-safe prevents pin back-driving.  
Reference Clock Output: XO pin is used for crystal only. This pin should be left floating when a  
CMOS-level oscillator is connected to XI.  
XO  
O
LED/GPIO INTERFACE  
LED_0 /  
35  
S, PD, IO  
S, PD, IO  
IO  
LED_0: Link Status  
GPIO_0  
LED_1 /  
6
LED_1: Link Status and BLINK for TX/RX Activity  
Clock Output: 25-MHz reference clock  
GPIO_1  
CLKOUT /  
16  
GPIO_2  
MEDIUM DEPENDENT INTERFACE  
TRD_M  
TRD_P  
13  
12  
Differential Transmit and Receive: Bidirectional differential signaling configured for 100BASE-T1  
operation, IEEE 802.3bw compliant.  
IO  
JTAG (IEEE 1149.1)  
Test Clock: Primary clock source for all test logic input and output. This pin is controlled by the  
testing entity.  
TCK  
17  
PU, I  
This pin can be left unconnected if not used.  
Copyright © 2017–2018, Texas Instruments Incorporated  
5

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