CAT35C704
Preliminary
ABSOLUTE MAXIMUM RATINGS*
*COMMENT
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature....................... –65°C to +150°C
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Voltage on Any Pin with
Respect to Ground(1) ........... –2.0V to +VCC + 2.0V
VCC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current(2) ........................ 100mA
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Endurance
Min.
100,000
100
Max.
Units
Cycles/Byte
Years
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
(3)
NEND
(3)
TDR
Data Retention
ESD Susceptability
Latch-up
(3)
VZAP
2000
100
Volts
(3)(4)
ILTH
mA
D.C. CHARACTERISTICS
VCC = +5V ±10%,unless otherwise specified.
Limits
Typ.
Symbol
Parameter
Min.
Max.
Units
Test Conditions
ICC
Power Supply Current
(Operating)
3
mA
VCC = 5.5V, CS = VCC
DO is Unloaded.
ISB
Power Supply Current
(Standby)
250
0.8
µA
VCC = 5.5V, CS = 0V
DI = 0V, CLK = 0V
VIL
Input Low Voltage
–0.1
2
V
V
VIH
VOL
VOH
Input High Voltage
Output Low Voltage
Output High Voltage
Input Leakage Current
Output Leakage Current
0.4
V
IOL = 2.1mA
2.4
V
IOH = –400µA
VIN = 5.5V
(5)
ILI
2
µA
µA
ILO
10
VOUT = 5.5V, CS = 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V +0.5V, which may overshoot to V + 2.0V for periods of less than 20ns.
CC
CC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V +1V.
CC
(5) PE pin test conditions: V < V < V
IH
IN
IL
Doc. No. 25045-00 2/98
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