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AT27BV256-70JU-T PDF预览

AT27BV256-70JU-T

更新时间: 2024-02-07 08:17:00
品牌 Logo 应用领域
美国微芯 - MICROCHIP OTP只读存储器内存集成电路
页数 文件大小 规格书
12页 768K
描述
IC OTP 256KBIT 70NS 32PLCC

AT27BV256-70JU-T 技术参数

生命周期:Active包装说明:LCC-32
Reach Compliance Code:compliant风险等级:0.99
最长访问时间:70 ns其他特性:ALSO OPERATES AT 5V SUPPLY
JESD-30 代码:R-PQCC-J32长度:13.97 mm
内存密度:262144 bit内存集成电路类型:OTP ROM
内存宽度:8功能数量:1
端子数量:32字数:32768 words
字数代码:32000工作模式:ASYNCHRONOUS
最高工作温度:85 °C最低工作温度:-40 °C
组织:32KX8封装主体材料:PLASTIC/EPOXY
封装代码:QCCJ封装形状:RECTANGULAR
封装形式:CHIP CARRIER并行/串行:PARALLEL
座面最大高度:3.556 mm最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):2.7 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:INDUSTRIAL端子形式:J BEND
端子节距:1.27 mm端子位置:QUAD
宽度:11.43 mm

AT27BV256-70JU-T 数据手册

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Atmel AT27BV256  
Table 5-4.  
AC characteristics for read operation  
VCC = 2.7V to 3.6V and 4.5V to 5.5V  
Atmel AT27BV256-70  
Symbol  
Parameter  
Condition  
CE = OE = VIL  
OE = VIL  
Min  
Max  
70  
Units  
ns  
(3)  
tACC  
Address to output delay  
CE to output delay  
OE to output delay  
(2)  
tCE  
70  
ns  
(2)(3)  
tOE  
CE = VIL  
50  
ns  
OE or CE High to output float,  
whichever occurred first  
(4)(5)  
tDF  
40  
ns  
ns  
Output hold from address, CE or OE,  
whichever occurred first  
tOH  
0
Figure 5-1.  
AC waveforms for read operation(1)  
Notes: 1. Timing measurement references are 0.8V and 2.0V. Input AC drive levels are 0.45V and 2.4V, unless otherwise specified.  
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE.  
3. OE may be delayed up to tACC - tOE after the address is valid without impact on tACC  
4. This parameter is only sampled, and is not 100% tested.  
.
5. Output float is defined as the point when data is no longer driven.  
6. When reading an Atmel AT27BV256, a 0.1µF capacitor is required across VCC and ground to suppress spurious voltage  
transients.  
Figure 5-2.  
Input test waveform and measurement level  
tR, tF < 20ns (10% to 90%)  
5
0601F–EPROM–4/11  

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