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AM28F010-150JEB PDF预览

AM28F010-150JEB

更新时间: 2024-01-15 11:34:17
品牌 Logo 应用领域
超微 - AMD 闪存内存集成电路
页数 文件大小 规格书
35页 466K
描述
1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory

AM28F010-150JEB 数据手册

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FINAL  
Am28F010  
1 Megabit (128 K x 8-Bit)  
CMOS 12.0 Volt, Bulk Erase Flash Memory  
DISTINCTIVE CHARACTERISTICS  
High performance  
Flasherase™ Electrical Bulk Chip-Erase  
— 70 ns maximum access time  
— One second typical chip-erase  
CMOS Low power consumption  
— 30 mA maximum active current  
— 100 µA maximum standby current  
— No data retention power consumption  
Flashrite™ Programming  
— 10 µs typical byte-program  
Two seconds typical chip program  
Command register architecture for  
microprocessor/microcontroller compatible  
write interface  
Compatible with JEDEC-standard byte-wide  
32-Pin EPROM pinouts  
— 32-pin PDIP  
On-chip address and data latches  
— 32-pin PLCC  
Advanced CMOS flash memory technology  
— 32-pin TSOP  
— Low cost single transistor memory cell  
10,000 write/erase cycles minimum  
Automatic write/erase pulse stop timer  
Write and erase voltage 12.0 V ±5%  
Latch-up protected to 100 mA  
from –1 V to V  
+1 V  
CC  
GENERAL DESCRIPTION  
The Am28F010 is a 1 Megabit Flash memory orga-  
nized as 128 Kbytes of 8 bits each. AMD’s Flash mem-  
ories offer the most cost-effective and reliable read/  
write non-volatile random access memory. The  
Am28F010 is packaged in 32-pin PDIP, PLCC, and  
TSOP versions. It is designed to be reprogrammed  
and erased in-system or in standard EPROM pro-  
grammers. The Am28F010 is erased when shipped  
from the factory.  
AMD’s Flash technology reliably stores memory con-  
tents even after 10,000 erase and program cycles. The  
AMD cell is designed to optimize the erase and pro-  
gramming mechanisms. In addition, the combination of  
advanced tunnel oxide processing and low internal  
electric fields for erase and programming operations  
produces reliable cycling. The Am28F010 uses a  
12.0V±5% VPP high voltage input to perform the  
Flasherase and Flashrite algorithms.  
The standard Am28F010 offers access times as fast as  
70 ns, allowing operation of high-speed microproces-  
sors without wait states. To eliminate bus contention,  
the Am28F010 has separate chip enable (CE#) and  
output enable (OE#) controls.  
The highest degree of latch-up protection is achieved  
with AMD’s proprietary non-epi process. Latch-up pro-  
tection is provided for stresses up to 100 milliamps on  
address and data pins from –1 V to VCC +1 V.  
The Am28F010 is byte programmable using 10 ms pro-  
gramming pulses in accordance with AMD’s Flashrite  
programming algorithm. The typical room temperature  
programming time of the Am28F010 is two seconds.  
The entire chip is bulk erased using 10 ms erase pulses  
according to AMD’s Flasherase alrogithm. Typical era-  
sure at room temperature is accomplished in less than  
one second. The windowed package and the 15–20  
AMD’s Flash memories augment EPROM functionality  
with in-circuit electrical erasure and programming. The  
Am28F010 uses a command register to manage this  
functionality, while maintaining a JEDEC Flash Stan-  
dard 32-pin pinout. The command register allows for  
100% TTL level control inputs and fixed power supply  
levels during erase and programming, while maintain-  
ing maximum EPROM compatibility.  
Publication# 11559 Rev: H Amendment/+2  
Issue Date: January 1998  

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