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AFCT-5765xxZ PDF预览

AFCT-5765xxZ

更新时间: 2022-02-26 11:12:22
品牌 Logo 应用领域
安华高科 - AVAGO /
页数 文件大小 规格书
2页 70K
描述
Single-Mode SFP Optical Transceivers

AFCT-5765xxZ 数据手册

 浏览型号AFCT-5765xxZ的Datasheet PDF文件第1页 
Table 1a.  
Temperature Factor @ 40 °C  
Stress Factor at 50%  
1
1
Reliability Prediction Based On  
Telcordia SR-332 Issue 3 – Parts Count Method  
Environmental Factor  
1
Component  
Component Standard  
Failure Rate Deviation Quality Failure Rate Deviation  
Total  
Total Component  
Component Standard  
Telcordia  
Information  
Laser  
Telcordia (Photodiode)  
Telcordia: (91-170 transistor) 3  
Telcordia: (91-170 transistor) 1  
Fixed Ceramic  
Thick Film  
Component  
1G FP Laser Diode  
Photodiode  
IC  
Quantity (FITs)  
(FITs)  
81  
5.5  
Factor (FITs)  
(FITs)  
64.8  
4.4  
1
1
100  
7.7  
7.7  
7.7  
0.1  
0.18  
3.8  
0.8  
0.8  
0.8  
0.8  
1
80  
6.16  
18.48  
6.16  
0.3  
5.5  
5.5  
13.2  
4.4  
IC  
Capacitors  
Resistor  
3
5
1
0.01  
0.13  
3.9  
0.03  
0.65  
3.9  
1
1
0.9  
3.8  
IC 8-BIT MCU W/8K FLASH CMOS Technology  
256B RAM 36-LFBGA  
Connector  
PCB, Edge / Multi-Pin  
20  
0.13  
0.088  
1
2.6  
1.76  
118.4  
8.45E+06  
66.6  
Module Failure @ 40 °C (Total FITs)  
MTTF @ 40 °C (Hours)  
1.50E+07  
FITs at other temperatures can be derived following The limitations of the FIT prediction based on the Parts  
the procedure of Telcordia SR-332, assuming activation Count Method include the fact that the piece part failure  
energy, Ea, of 0.35 eV to determine the component tem- rates are obtained from Telcordia database, which may  
perature factor πT. Table 1b shows the FITs at different not be exhaustive for state-of-the-art piece parts, and that  
temperatures for the transceiver.  
the results are independent of true module environmen-  
tal stress tests. Nevertheless, the information obtained  
from the Parts Count Method is a useful reference during  
design-in and evaluation. Whenever possible, Avago sub-  
stitutes internal data for the FIT rates of individual com-  
ponents, and predictions will be updated as more current  
data becomes available.  
FITs between 60% and 90% Upper Confidence Levels  
(UCLs) can be derived following the procedure ofTelcordia  
SR-332 to determine the shape κ and scale θ of the gamma  
distribution. Table 1c shows the FITs at the UCLs.  
Table 1b. FIT rates at different operating case temperatures, Table 1c. FIT rates at 40 °C at 60% and 90% Upper Confidence  
following the Telcordia Parts Count Method  
Level, following the Telcordia Parts Count Method  
T
case  
(° C)  
FITs  
UCL  
FITs  
25  
40  
50  
60  
61.6  
60%  
122.8  
118.4  
177.6  
260.5  
90%  
207.7  
For product information and a complete list of distributors, please go to our web site: www.avagotech.com  
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries.  
Data subject to change. Copyright © 2005-2013 Avago Technologies. All rights reserved.  
AV02-3018EN - November 22, 2013  

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