Datasheet > AFCT-5715xxZ

AFCT-5715xxZ

更新时间： 2022-02-26 11:12:22

品牌	Logo	应用领域
安华高科 - AVAGO		/
页数	文件大小	规格书
2页	70K
描述
Single-Mode SFP Optical Transceivers

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AFCT-5715xxZ 数据手册

AFCT-5701xxZ, AFCT-5705xxZ, AFCT-5710xxZ,

AFCT-5715xxZ, AFCT-5765xxZ

Single-Mode SFP Optical Transceivers

with Optional DMI for Gigabit Ethernet and Fibre Channel

Reliability Data Sheet

Introduction

FIT Rate Summary

Avago Technologies Quality System includes an ongoing The mean and standard deviation of the AFCT-5701xxZ,

Reliability Monitoring program to generate a database AFCT-5705xxZ, AFCT-5710xxZ, and AFCT-5715xxZ families

from which this reliability datasheet is published.

of SFP Optical Transceiver steady-state failure rate is calcu-

lated as 118.4 FIT and 66.6 FIT at 40 °C, respectively.

Description

Conclusion

This reliability data sheet addresses reliability parameters

for the single-mode AFCT-5701xxZ, AFCT-5705xxZ, AFCT- Avago Technologies AFCT-5701xxZ, AFCT-5705xxZ, AFCT-

5710xxZ, AFCT-5715xxZ, and AFCT-5765xxZ families of 5710xxZ, AFCT-5715xxZ, and AFCT-5765xxZ families of

SFP optical transceivers.

SFP Optical Transceivers have completed and passed the

reliability qualiﬁcation criteria deﬁned by Avago Technol-

ogies’Quality & Reliability requirements.

These transceivers are primarily targeted at serving

Gigabit Ethernet or Fibre Channel links interconnecting

optical networking and storage equipment.

Random Failure Rate (FIT) Calculation

Reliability Qualiﬁcation

Failure in time rate, or FIT, is deﬁned as the number of

failures per billion device hours. In the product useful life

region, the random failure rate is considered as a constant

failure rate. In this region MTTF, Mean Time to Failure, is

deﬁned as MTTF = 1/FIT.

The Optical Transceivers have been qualiﬁed in accor-

dance with the requirements of Telcordia Document

GR-468-CORE. Reliability predictions follow the method of

Telcordia SR-332 Issue 3.

FITs Prediction Based on Telcordia SR-332 Parts Count

Procedure

Avago internal test speciﬁcations have also been applied.

Testing was carried out under the supervision of Avago

Technologies Quality & Reliability Department.

The Telcordia Parts Count Method assumes that the

module failure rate is equal to the sum of the device

component failure rates. Modiﬁers are included to take

into consideration variations in module operation envi-

ronments, device quality requirements, temperature, and

stress. Table 1a shows the FITs for the components used in

the module and the total FITs that has been calculated for

a case temperature of 40 °C.

Stress Test Pass Criteria

Product failure has occurred when the units fails to

respond properly to a functional test condition. The func-

tional test condition should not exceed the absolute

maximum data sheet limits for the product.

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