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ADuM3220WARZ-RL7 PDF预览

ADuM3220WARZ-RL7

更新时间: 2022-04-14 18:30:11
品牌 Logo 应用领域
亚德诺 - ADI 驱动器栅极栅极驱动
页数 文件大小 规格书
16页 614K
描述
Isolated, 4 A Dual-Channel Gate Driver

ADuM3220WARZ-RL7 数据手册

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Data Sheet  
ADuM3220/ADuM3221  
ABSOLUTE MAXIMUM RATINGS  
Ambient temperature = 25°C, unless otherwise noted.  
Table 8.  
Table 9. Maximum Continuous Working Voltage1  
Parameter  
Max  
Unit  
Constraint  
Parameter  
Rating  
AC Bipolar Voltage2  
565  
V peak 50-year minimum lifetime  
V peak 50-year minimum lifetime  
V peak 50-year minimum lifetime  
Storage Temperature (TST)  
Operating Temperature (TJ)  
Supply Voltage Ranges1  
VDD1  
−55°C to +150°C  
−40°C to +150°C  
AC Unipolar Voltage3 1131  
DC Voltage4  
1131  
1 Refers to the continuous voltage magnitude imposed across the isolation  
−0.5 V to +7.0 V  
−0.5 V to +20 V  
−0.5 V to VDDI + 0.5 V  
−0.5 V to VDDO + 0.5 V  
−23 mA to +23 mA  
−100 kV/µs to +100 kV/µs  
barrier. See the Insulation Lifetime section for more information.  
VDD2  
2 See Figure 24.  
3 See Figure 25.  
4 See Figure 26.  
Input Voltage Range (VIA, VIB)1, 2  
Output Voltage Range (VOA, VOB)1, 2  
Average Output Current per Pin (IO)3  
ESD CAUTION  
Common-Mode Transients,  
(CMH, CML)4  
1 All voltages are relative to their respective ground.  
2 VDDI and VDDO refer to the supply voltages on the input and output sides of  
a given channel, respectively.  
3 See Figure 3 for information about maximum allowable current for various  
temperatures.  
4 Refers to common-mode transients across the insulation barrier. Common-  
mode transients exceeding the Absolute Maximum Rating can cause latch-up  
or permanent damage.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Rev. C | Page 7 of 16  
 
 
 
 

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