ADT14GS

更新时间： 2024-02-18 10:19:19

品牌	Logo	应用领域
亚德诺 - ADI		传感器换能器输出元件监控
页数	文件大小	规格书
16页	340K
描述
Quad Setpoint, Programmable Temperature Monitor and Controller

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数据手册

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ADT14GS 数据手册

ADT14

(V+ = +5 V, GND = 0 V, T_A= +25؇C unless otherwise noted)

WAFER TEST LIMITS

Parameter

Symbol

Conditions

Min

Typ Max

Units

INPUTS SET HIGH, SET LOW

Input Bias Current

I_B

°C

OUTPUT VPTAT

Temperature Accuracy

T_A= +25°C, No Load

1.5

OUTPUT V_REF

Nominal Value

Line Regulation

Load Regulation

V_REF

T_A= +25°C, No Load

4.5 V ≤ V ≤ 13.2 V

10 µA ≤ IV_REF≤ 500 µA

2.490

2.510

±0.08 %/V

±0.25 %/mA

OPEN-COLLECTOR OUTPUTS OVER, UNDER

Output Low Voltage

Output Leakage Current

V_OL

I_OH

I_SINK= 1.6 mA

0.4

100

µA

POWER SUPPLY

Supply Range

Supply Current

V+

I_SY

4.5

5.5

600

µA

Unloaded

NOTE

Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly and nominal yield loss, yield after packaging is not guaranteed for

standard product dice. Consult factory to negotiate specifications based on lot qualification through sample lot assembly and testing.

DICE CHARACTERISTICS

Die Size 0.069 × 0.080 inch, 5520 sq. mils

(1.75 × 2.03 mm, 3.55 sq. mm)

Transistor Count: 130

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily

accumulate on the human body and test equipment and can discharge without detection.

Although the ADT14 features proprietary ESD protection circuitry, permanent damage may

occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD

precautions are recommended to avoid performance degradation or loss of functionality.

WARNING!

ESD SENSITIVE DEVICE

REV. 0

–3–

1 234 5 6 7...16

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