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ADP130-2.5-EVALZ PDF预览

ADP130-2.5-EVALZ

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
亚德诺 - ADI 稳压器
页数 文件大小 规格书
20页 505K
描述
350 mA, Low VIN, Low Quiescent Current, CMOS Linear Regulator

ADP130-2.5-EVALZ 数据手册

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ADP130  
ABSOLUTE MAXIMUM RATINGS  
The junction-to-ambient thermal resistance (θJA) of the package  
is based on modeling and calculation using a four-layer board.  
The junction-to-ambient thermal resistance is highly dependent  
on the application and board layout. In applications where high  
maximum power dissipation exists, close attention to thermal  
board design is required. The value of θJA may vary, depending on  
PCB material, layout, and environmental conditions. The specified  
values of θJA are based on a four-layer, 4 in × 3 in circuit board.  
For details about board construction, refer to JEDEC JESD51-7.  
Table 3.  
Parameter  
Rating  
VIN to GND  
VBIAS to GND  
EN to GND  
VOUT to GND  
Storage Temperature Range  
Operating Temperature Range  
Operating Junction Temperature  
Lead Temperature (Soldering, 10 sec)  
−0.3 V to +3.6 V  
−0.3 V to +6 V  
−0.3 V to +6 V  
−0.3 V to VIN  
−65°C to +150°C  
−40°C to +125°C  
125°C  
ΨJB is the junction-to-board thermal characterization parameter  
with units of °C/W. ΨJB of the package is based on modeling and  
calculation using a four-layer board. The JEDEC JESD51-12  
document, Guidelines for Reporting and Using Package Thermal  
Information, states that thermal characterization parameters are  
not the same as thermal resistances. ΨJB measures the component  
power flowing through multiple thermal paths rather than a single  
path, as in thermal resistance (θJB). Therefore, ΨJB thermal paths  
include convection from the top of the package as well as radiation  
from the package, factors that make ΨJB more useful in real world  
applications. Maximum junction temperature (TJ) is calculated  
from the board temperature (TB) and power dissipation (PD), using  
the following formula:  
300°C  
Stresses above those listed under absolute maximum ratings  
may cause permanent damage to the device. This is a stress  
rating only and functional operation of the device at these or  
any other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
THERMAL DATA  
Absolute maximum ratings apply only individually, not in combi-  
nation. The ADP130 may be damaged when junction temperature  
limits are exceeded. Monitoring ambient temperature does not  
guarantee that the junction temperature is within the specified  
temperature limits. In applications with high power dissipation  
and poor thermal resistance, the maximum ambient temperature  
may need to be derated. In applications with moderate power  
dissipation and low PCB thermal resistance, the maximum ambient  
temperature can exceed the maximum limit as long as the junction  
temperature is within specification limits. The junction tempera-  
ture (TJ) of the device is dependent on the ambient temperature  
(TA), the power dissipation of the device (PD), and the junction-to-  
ambient thermal resistance of the package (θJA). TJ is calculated  
using the following formula:  
TJ = TB + (PD × ΨJB)  
Refer to the JEDEC JESD51-8 and JESD51-12 documents for  
more detailed information about ΨJB.  
THERMAL RESISTANCE  
θJA and ΨJB are specified for the worst-case conditions, that is, a  
device soldered in a circuit board for surface-mount packages.  
Table 4. Thermal Resistance  
Package Type  
θJA  
ΨJB  
Unit  
5-Lead TSOT  
170  
43  
°C/W  
TJ = TA + (PD × θJA)  
ESD CAUTION  
Rev. 0 | Page 5 of 20  
 

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