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ADA-4543-TR1G

更新时间： 2024-01-07 08:21:30

品牌	Logo	应用领域
安捷伦 - AGILENT		放大器
页数	文件大小	规格书
10页	111K
描述
Silicon Bipolar Darlington Amplifier

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数据手册

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ADA-4543-TR1G 数据手册

ADA-4543 Absolute Maximum Ratings^[1]

Notes:

Absolute

1. Operation of this device above any one of

these parameters may cause permanent

damage.

Symbol

Parameter

Units

Maximum

I_d

Device Current

2. Ground lead temperature is 25°C. Derate

6.6 mW/°C for TL >128°C.

3. Junction-to-case thermal resistance

measured using 150°C Liquid Crystal

Measurement method.

P_diss

P_{in max.}

T_j

Total Power Dissipation^[2]

RF Input Power

dBm

°C

145

Channel Temperature

Storage Temperature

Thermal Resistance^[3]

150

T_STG

θ_jc

°C

-65 to 150

152

°C/W

ADA-4543 Electrical Specifications

T_A= 25°C, Zo=50Ω, Pin = -25 dBm, I_d= 15 mA (unless specified otherwise)

Symbol

Parameter and Test Condition:

Frequency

Units

Min.

Typ.

Max.

Std. Dev.

I_d= 15 mA, Zo = 50Ω

V_d

Device Voltage I_d=15 mA

Power Gain (|S₂₁|²

3.1

3.4

3.8

100 MHz

15.7

15.1

900 MHz^[1,2]

13.5

16.5

∆Gp

Gain Flatness

100 to 900 MHz

0.1 to 2 GHz

0.4

1.5

F_3dB

3 dB Bandwidth

GHz

3.6

VSMR_in

VSMR_out

Input Voltage Standing Wave Ratio

Output Voltage Standing Wave Ratio

50Ω Noise Figure

0.1 to 6 GHz

1.7:1

1.3:1

100 MHz

900 MHz^[1,2]

3.6

3.7

0.16

0.18

P_1dB

OIP₃

Output Power at 1dB Gain Compression

Output 3^rdOrder Intercept Point

100 MHz

dBm

mV/°C

2.5

1.9

900 MHz^[1,2]

100 MHz^[3]

14.6

15.0

900 MHz^[1,2,3]

DV/dT

Device Voltage Temperature Coefficient

-5.6

Notes:

1. Typical value determined from a sample size of 500 parts from 3 wafers.

2. Measurement obtained using production test board described in the block diagram below.

3. I) 900 MHz OIP₃test condition: F1 = 900 MHz, F2 = 905 MHz and Pin = -25 dBm per tone.

II) 100 MHz OIP₃test condition: F1 = 100 MHz, F2 = 105 MHz and Pin = -25 dBm per tone.

50 Ohm

Transmission

(0.5 dB loss)

50 Ohm

Input

Output

Transmission

including Bias

(0.5 dB loss)

DUT

Block diagram of 900 MHz production test board used for V_d, Gain, P_1dB, OIP₃, and NF measurements.

Circuit losses have been de-embedded from actual measurements.

123 4 5 6 7...10

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