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AD8222HBCPZ-R7 PDF预览

AD8222HBCPZ-R7

更新时间: 2024-01-03 11:35:38
品牌 Logo 应用领域
亚德诺 - ADI 仪表放大器
页数 文件大小 规格书
24页 417K
描述
Precision, Dual-Channel Instrumentation Amplifier

AD8222HBCPZ-R7 数据手册

 浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第3页浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第4页浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第5页浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第7页浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第8页浏览型号AD8222HBCPZ-R7的Datasheet PDF文件第9页 
AD8222  
ABSOLUTE MAXIMUM RATINGS  
Table 5.  
THERMAL RESISTANCE  
Parameter  
Rating  
Table 6.  
Package  
Supply Voltage  
18 V  
Indefinite  
VS  
VS  
−65°C to +130°C  
−40°C to +125°C  
130°C  
θJA  
86  
48  
Unit  
°C/W  
°C/W  
Output Short-Circuit Current Duration  
Input Voltage (Common Mode)  
Differential Input Voltage  
Storage Temperature Range  
Operational Temperature Range  
Package Glass Transition Temperature (TG)  
ESD  
CP-16-19: LFCSP Without Thermal Pad  
CP-16-13: LFCSP with Thermal Pad  
The θJA values in Table 6 assume a 4-layer JEDEC standard  
board. For the LFCSP with thermal pad, it is assumed that the  
thermal pad is soldered to a landing on the PCB board, with the  
landing thermally connected to a heat dissipating power plane.  
θJC at the exposed pad is 4.4°C/W.  
Human Body Model  
Charge Device Model  
1 kV  
1 kV  
Maximum Power Dissipation  
The maximum safe power dissipation for the AD8222 is limited  
by the associated rise in junction temperature (TJ) on the die. At  
approximately 130C, which is the glass transition temperature,  
the plastic changes its properties. Even temporarily exceeding  
this temperature limit may change the stresses that the package  
exerts on the die, permanently shifting the parametric performance  
of the amplifiers. Exceeding a temperature of 130°C for an  
extended period can result in a loss of functionality.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only; functional operation of the device at these or any  
other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions may affect device reliability.  
ESD CAUTION  
Rev. A | Page 6 of 24  
 
 
 
 

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