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AD5752AREZ-REEL7 PDF预览

AD5752AREZ-REEL7

更新时间: 2022-12-21 14:11:49
品牌 Logo 应用领域
亚德诺 - ADI /
页数 文件大小 规格书
32页 990K
描述
Complete, Dual, 12-/14-/16-Bit, Serial Input, Unipolar/Bipolar, Voltage Output DACs

AD5752AREZ-REEL7 数据手册

 浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第2页浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第3页浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第4页浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第6页浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第7页浏览型号AD5752AREZ-REEL7的Datasheet PDF文件第8页 
AD5722/AD5732/AD5752  
AC PERFORMANCE CHARACTERISTICS  
AVDD = 4.5 V1 to 16.5 V; AVSS = −4.5 V to −16.5 V, or AVSS = 0 V; GND = 0 V; REFIN = 2.5 V; DVCC = 2.7 V to 5.5 V; RLOAD = 2 kΩ;  
LOAD = 200 pF; all specifications TMIN to TMAX, unless otherwise noted.  
C
Table 2.  
Parameter2  
Min  
Typ  
Max  
Unit  
Test Conditions/Comments  
DYNAMIC PERFORMANCE  
Output Voltage Settling Time  
10  
7.5  
12  
8.5  
5
μs  
μs  
μs  
20 V step to 0.03% FSR  
10 V step to 0.03% FSR  
512 LSB step settling (16-bit resolution)  
Slew Rate  
3.5  
13  
35  
10  
10  
0.6  
V/μs  
nV-sec  
mV  
nV-sec  
nV-sec  
nV-sec  
Digital-to-Analog Glitch Energy  
Glitch Impulse Peak Amplitude  
Digital Crosstalk  
DAC-to-DAC Crosstalk  
Digital Feedthrough  
Output Noise  
0.1 Hz to 10 Hz Bandwidth  
100 kHz Bandwidth  
Output Noise Spectral Density  
15  
80  
320  
μV p-p  
μV rms  
nV/√Hz  
0x8000 DAC code  
Measured at 10 kHz, 0x8000 DAC code  
1 For specified performance, the maximum headroom requirement is 0.9 V.  
2 Guaranteed by design and characterization; not production tested.  
TIMING CHARACTERISTICS  
AVDD = 4.5 V to 16.5 V; AVSS = −4.5 V to −16.5 V, or AVSS = 0 V; GND = 0 V; REFIN = 2.5 V; DVCC = 2.7 V to 5.5 V; RLOAD = 2 kΩ; CLOAD  
200 pF; all specifications tMIN to tMAX, unless otherwise noted.  
=
Table 3.  
Parameter1, 2, 3  
Limit at tMIN, tMAX  
Unit  
Description  
t1  
t2  
t3  
t4  
33  
13  
13  
13  
13  
100  
5
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
μs max  
ns min  
μs max  
ns min  
ns max  
ns min  
SCLK cycle time  
SCLK high time  
SCLK low time  
SYNC falling edge to SCLK falling edge setup time  
SCLK falling edge to SYNC rising edge  
Minimum SYNC high time (write mode)  
Data setup time  
t5  
t6  
t7  
t8  
t9  
0
Data hold time  
20  
20  
20  
10  
20  
2.5  
13  
40  
200  
LDAC falling edge to SYNC falling edge  
SYNC rising edge to LDAC falling edge  
LDAC pulse width low  
t10  
t11  
t12  
t13  
t14  
DAC output settling time  
CLR pulse width low  
CLR pulse activation time  
4
t15  
SYNC rising edge to SCLK falling edge  
SCLK rising edge to SDO valid (CL SDO5 = 15 pF)  
Minimum SYNC high time (readback/daisy-chain mode)  
4
t16  
t17  
1 Guaranteed by characterization; not production tested.  
2 All input signals are specified with tR = tF = 5 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V.  
3 See Figure 2, Figure 3, and Figure 4.  
4 Daisy-chain and readback mode.  
5 CL SDO = capacitive load on SDO output.  
Rev. 0 | Page 5 of 32  
 
 
 
 

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