AD5722/AD5732/AD5752
AC PERFORMANCE CHARACTERISTICS
AVDD = 4.5 V1 to 16.5 V; AVSS = −4.5 V to −16.5 V, or AVSS = 0 V; GND = 0 V; REFIN = 2.5 V; DVCC = 2.7 V to 5.5 V; RLOAD = 2 kΩ;
LOAD = 200 pF; all specifications TMIN to TMAX, unless otherwise noted.
C
Table 2.
Parameter2
Min
Typ
Max
Unit
Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time
10
7.5
12
8.5
5
μs
μs
μs
20 V step to 0.03% FSR
10 V step to 0.03% FSR
512 LSB step settling (16-bit resolution)
Slew Rate
3.5
13
35
10
10
0.6
V/μs
nV-sec
mV
nV-sec
nV-sec
nV-sec
Digital-to-Analog Glitch Energy
Glitch Impulse Peak Amplitude
Digital Crosstalk
DAC-to-DAC Crosstalk
Digital Feedthrough
Output Noise
0.1 Hz to 10 Hz Bandwidth
100 kHz Bandwidth
Output Noise Spectral Density
15
80
320
μV p-p
μV rms
nV/√Hz
0x8000 DAC code
Measured at 10 kHz, 0x8000 DAC code
1 For specified performance, the maximum headroom requirement is 0.9 V.
2 Guaranteed by design and characterization; not production tested.
TIMING CHARACTERISTICS
AVDD = 4.5 V to 16.5 V; AVSS = −4.5 V to −16.5 V, or AVSS = 0 V; GND = 0 V; REFIN = 2.5 V; DVCC = 2.7 V to 5.5 V; RLOAD = 2 kΩ; CLOAD
200 pF; all specifications tMIN to tMAX, unless otherwise noted.
=
Table 3.
Parameter1, 2, 3
Limit at tMIN, tMAX
Unit
Description
t1
t2
t3
t4
33
13
13
13
13
100
5
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
μs max
ns min
μs max
ns min
ns max
ns min
SCLK cycle time
SCLK high time
SCLK low time
SYNC falling edge to SCLK falling edge setup time
SCLK falling edge to SYNC rising edge
Minimum SYNC high time (write mode)
Data setup time
t5
t6
t7
t8
t9
0
Data hold time
20
20
20
10
20
2.5
13
40
200
LDAC falling edge to SYNC falling edge
SYNC rising edge to LDAC falling edge
LDAC pulse width low
t10
t11
t12
t13
t14
DAC output settling time
CLR pulse width low
CLR pulse activation time
4
t15
SYNC rising edge to SCLK falling edge
SCLK rising edge to SDO valid (CL SDO5 = 15 pF)
Minimum SYNC high time (readback/daisy-chain mode)
4
t16
t17
1 Guaranteed by characterization; not production tested.
2 All input signals are specified with tR = tF = 5 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V.
3 See Figure 2, Figure 3, and Figure 4.
4 Daisy-chain and readback mode.
5 CL SDO = capacitive load on SDO output.
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