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ACS770ECB-200U-PSF-T PDF预览

ACS770ECB-200U-PSF-T

更新时间: 2024-02-19 10:38:48
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描述
4.1 μs output rise time in response to step input current

ACS770ECB-200U-PSF-T 数据手册

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Thermally Enhanced, Fully Integrated, Hall-Effect-Based  
High-Precision Linear Current Sensor IC with 100 µΩ Current Conductor  
ACS770xCB  
X050B PERFORMANCE CHARACTERISTICS [1]: TOP = –40°C to 150°C, CBYP = 0.1 μF, VCC= 5 V, unless otherwise specified  
Characteristic  
Symbol  
Test Conditions  
Min.  
–50  
Typ.  
Max.  
50  
Unit  
A
Primary Sampled Current  
IP  
SensTA  
Measured using full-scale IP, TA = 25°C  
39.04  
39.04  
38.6  
40  
40  
40  
40.96  
40.96  
41.4  
mV/A  
mV/A  
mV/A  
Sensitivity [2]  
Sens(TOP)HT Measured using full-scale IP, TOP = 25°C to 150°C  
Sens(TOP)LT Measured using full-scale IP, TOP = –40°C to 25°C  
TOP = –40°C to 150°C, shift after AEC-Q100 grade 0  
Sensitivity Drift Over Lifetime [3] ΔSensLIFE  
–0.72  
±0.24  
0.72  
mV/A  
qualification testing  
Noise [4]  
VNOISE  
ELIN  
TA= 25°C, 10 nF on VIOUT pin to GND  
Measured using full-scale and half-scale IP,  
IP = 0 A, TA = 25°C  
10  
mV  
%
Nonlinearity  
–1  
1
VOE(TA)  
–10  
–10  
–20  
±4  
±6  
±6  
10  
10  
20  
mV  
mV  
mV  
Electrical Offset Voltage [5][6]  
VOE(TOP)HT IP = 0 A, TOP = 25°C to 150°C  
VOE(TOP)LT IP = 0 A, TOP = –40°C to 25°C  
Electrical Offset Voltage Drift  
Over Lifetime [3]  
IP = 0 A, TOP = –40°C to 150°C, shift after AEC-Q100 grade 0  
qualification testing  
∆VOE(LIFE)  
–5  
±2  
5
mV  
Magnetic Offset Error  
IERROM  
ETOT(TA)  
ETOT(HT)  
ETOT(LT)  
IP = 0 A, TA = 25°C, after excursion of 50 A  
Measured using full-scale IP, TA = 25°C  
Measured using full-scale IP, TOP = 25°C to 150°C  
Measured using full-scale IP, TOP = –40°C to 25°C  
120  
±0.5  
±1.5  
±2  
300  
2.4  
2.4  
3.5  
mA  
%
–2.4  
–2.4  
–3.5  
Total Output Error [7]  
%
%
Total Output Error Drift Over  
Lifetime [3]  
TOP = –40°C to 150°C, shift after AEC-Q100 grade 0  
qualification testing  
ΔETOT(LIFE)  
–1.9  
±0.6  
1.9  
%
1 See Characteristic Performance Data page for parameter distributions over temperature range.  
2 This parameter may drift a maximum of ΔSensLIFE over lifetime.  
3 Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift  
is a function of customer application conditions. Contact Allegro MicroSystems for further information.  
4 ±3 sigma noise voltage.  
5 Drift is referred to ideal VIOUT(QBI) = 2.5 V.  
6 This parameter may drift a maximum of ΔVOE(LIFE) over lifetime.  
7 This parameter may drift a maximum of ΔETOT(LIFE) over lifetime.  
Allegro MicroSystems, LLC  
115 Northeast Cutoff  
6
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  

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