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A6279ELW-T PDF预览

A6279ELW-T

更新时间: 2024-02-29 02:16:39
品牌 Logo 应用领域
急速微 - ALLEGRO 显示驱动器驱动程序和接口接口集成电路光电二极管信息通信管理
页数 文件大小 规格书
18页 621K
描述
Serial-Input Constant-Current Latched LED Drivers with Open LED Detection

A6279ELW-T 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:SOIC包装说明:SOP, SOP24,.4
针数:24Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.39.00.01
风险等级:5.82Is Samacsys:N
数据输入模式:SERIAL显示模式:DOT MATRIX
接口集成电路类型:LED DISPLAY DRIVERJESD-30 代码:R-PDSO-G24
JESD-609代码:e3长度:15.4 mm
湿度敏感等级:3复用显示功能:NO
功能数量:1区段数:16
端子数量:24最高工作温度:85 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP24,.4
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):260电源:3.3/5 V
认证状态:Not Qualified座面最大高度:2.65 mm
子类别:Display Drivers最大供电电压:5.5 V
最小供电电压:3 V标称供电电压:5 V
表面贴装:YES技术:BICMOS
温度等级:INDUSTRIAL端子面层:Matte Tin (Sn)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:40
宽度:7.5 mmBase Number Matches:1

A6279ELW-T 数据手册

 浏览型号A6279ELW-T的Datasheet PDF文件第4页浏览型号A6279ELW-T的Datasheet PDF文件第5页浏览型号A6279ELW-T的Datasheet PDF文件第6页浏览型号A6279ELW-T的Datasheet PDF文件第8页浏览型号A6279ELW-T的Datasheet PDF文件第9页浏览型号A6279ELW-T的Datasheet PDF文件第10页 
A6278 and  
A6279  
Serial-Input, Constant-Current Latched  
LED Drivers with Open LED Detection  
Functional Description  
Open circuit detection does not take place until the sequence in  
Normal Mode  
Panel B on page 7 is performed. During this sequence, the OE  
pin must be held low for a minimum of 2 μs (tW(OE1)) to ensure  
proper settling of the output currents and be given a minimum of  
three CLOCK pulses. During the period that the OE pin is low  
(active), OCD testing begins. The VCE voltage on each of the  
output pins is compared to the Open LED Detection Theshold,  
VCE(OCD). If the VCE of an enabled output is lower than VCE(OCD)  
an error bit value of 0 is set in the corresponding shift register. A  
value of 1 will be set if no error is detected. If a particular output  
is not enabled, a 0 will be set. The error codes are summarized in  
the following table:  
Serial data present at the SERIAL DATA IN input is transferred  
to the shift register on the logic 0-to-logic 1 transition of the  
CLOCK input pulse. On succeeding CLOCK pulses, the register  
shifts data towards the SERIAL DATA OUT pin. The serial data  
must appear at the input prior to the rising edge of the CLOCK  
input waveform.  
,
Data present in any register is transferred to the respective latch  
when the LATCH ENABLE input is high (serial-to-parallel con-  
version). The latches continue to accept new data as long as the  
LATCH ENABLE input is held high.  
Applications where the latches are bypassed (LATCH ENABLE  
tied high) will require that the OUTPUT ENABLE input be high  
during serial data entry. When the OUTPUT ENABLE input is  
high, the output sink drivers are disabled (OFF).  
Output State Test Condition Error Code Meaning  
Output State  
Test Condition Error Code  
Meaning  
N/A  
OFF  
N/A  
0
0
1
V
CE < VCE(OCD)  
Open/TSD  
Normal  
ON  
The data stored in the latches is not affected by the OUTPUT  
ENABLE input. With the OUTPUT ENABLE input active (low),  
the outputs are controlled by the state of their respective latches.  
VCE VCE(OCD)  
LED Open Circuit Detection (Test) Mode  
After the testing process, setting the OE pin high causes the shift  
registers to latch the error code data where it can then be clocked  
out of the SERIAL DATA OUT pin. The OCD latching sequence  
(OE low, 3 CLOCK pulses, OE high as shown in panel B of the  
LED OCD timing diagram) can then be repeated if necessary to  
look for intermittent contact problems.  
The LED Open Circuit Detection (OCD) mode, or Test mode,  
is entered by clocking in the LED OCD mode initialization  
sequence on the OUTPUT ENABLE (OE) and LATCH ENABLE  
(LE) pins. In Normal mode, the OE and LE pins do not change  
states while the CLOCK signal is cycling. The initialization  
sequence is shown in panel A of the LED OCD timing require-  
ments diagram on page 7.  
The state of the outputs can be programmed with new data at any  
time while in LED OCD mode (the same as in Normal mode).  
This allows specific patterns to be tested for open circuits. The  
pattern that is latched will then be tested during the OCD latching  
sequence and the resulting bit values can be clocked out of the  
SERIAL DATA OUT pin.  
Note: Each step event during mode sequencing happens on the  
leading edge of the CLOCK signal. Five step events (CLOCK  
pulses) are required to enter OCD mode and five step events are  
required to return to Normal mode.  
A pattern, such as all highs, should first be loaded into the reg-  
isters and latched leaving LE low. The device is then sequenced  
into LED OCD mode. It should be noted that data is still being  
sent through the shift registers while entering the LED OCD  
mode. However, this data is not latched when the LE pin goes  
high and sees a CLOCK pulse during the initialization sequence.  
Note: LED Open Circuit Detection will not work properly if the  
current is being externally limited by resistors to within the set  
current limit for the device.  
To return to Normal mode, perform the clocking sequence shown  
in panel C of the timing diagram on the OE and LE pins.  
Allegro MicroSystems, Inc.  
115 Northeast Cutoff, Box 15036  
7
Worcester, Massachusetts 01615-0036 (508) 853-5000  
www.allegromicro.com  

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