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A32200 PDF预览

A32200

更新时间: 2022-04-22 07:46:34
品牌 Logo 应用领域
ACTEL 布线
页数 文件大小 规格书
98页 2009K
描述
Highly Predictable Performance with 100% Automatic Placement and Routing

A32200 数据手册

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Product Family Profile  
Family  
Device  
ACT 2  
ACT 1  
A1240A  
A1280A  
A1010B  
A1020B  
Capacity  
System Gates  
Logic Gates  
SRAM Bits  
6,000  
4,000  
NA  
12,000  
8,000  
NA  
1,800  
1,200  
NA  
3,000  
2,000  
NA  
Logic Modules  
S-Modules  
C-Modules  
Decode  
684  
348  
336  
NA  
1,232  
624  
608  
NA  
295  
295  
NA  
547  
547  
NA  
Flip-Flops (maximum)  
User I/Os (maximum)  
568  
104  
998  
140  
147  
57  
273  
69  
Packages (by pin count)  
CPGA  
CQFP  
132  
176  
172  
84  
84  
84  
Performance  
20 MHz  
20 MHz  
System Speed (maximum)  
40 MHz  
40 MHz  
High-Reliability, Low-Risk Solution  
junction temperatures. Actel’s non-PLD architecture delivers  
lower dynamic operating current. Our reliability tests show a  
very low failure rate of 6.6 FITs at 90°C junction temperature  
with no degradation in AC performance. Special stress testing  
at wafer test eliminates infant mortalities prior to packaging.  
Actel builds the most reliable field programmable gate arrays  
(FPGAs) in the industry, with overall antifuse reliability  
ratings of less than 10 Failures-In-Time (FITs),  
corresponding to a useful life of more than 40 years. Actel  
FPGAs have been production proven, with more than five  
million devices shipped and more than one trillion antifuses  
manufactured. Actel devices are fully tested prior to  
shipment, with an outgoing defect level of less than 100 ppm.  
(Further reliability data is available in the Actel Device  
Reliability Report, at http://www.actel.com/hirel).  
Minimized Security Risk  
Reverse engineering of programmed Actel devices from  
optical or electrical data is extremely difficult. Programmed  
antifuses cannot be identified from a photograph or by using  
an SEM. The antifuse map cannot be deciphered either  
electrically or by microprobing. Each device has a silicon  
signature that identifies its origins, down to the wafer lot and  
fabrication facility.  
Benefits  
Minimized Cost Risk  
Minimized Testing Risk  
With Actel’s line of development tools, designers can produce  
as many chips as they choose for just the cost of the device  
itself. There will be no NRE charges to cut into the  
development budget each time a new design is tried.  
Unprogrammed Actel parts are extensively tested at the  
factory. Routing tracks, logic modules, and programming,  
debug and test circuits are 100 percent tested before  
shipment. AC performance is ensured by special speed path  
tests, and programming circuitry is verified on test antifuses.  
During the programming process, an algorithm is run to  
ensure that all antifuses are correctly programmed. In  
addition, Actel’s Silicon Explorer diagnostic tool uses  
ActionProbe circuitry, allowing 100 percent observability of  
all internal nodes to check and debug the design.  
Minimized Time Risk  
After the design is entered, placement and routing is  
automatic, and programming the device takes only about 5 to  
15 minutes for an average design. Designers save time in the  
design entry process by using tools with which they are  
familiar.  
Minimized Reliability Risk  
Actel FPGA Description  
The PLICE antifuse is a one-time programmable, nonvolatile  
connection. Since Actel devices are permanently  
programmed, no downloading from EPROM or SRAM storage  
is required. Inadvertent erasure is impossible, and there is no  
need to reload the program after power disruptions.  
Fabrication using a low-power CMOS process means cooler  
The Actel families of FPGAs offer a variety of packages,  
speed/performance characteristics, and processing levels for  
use in all high reliability and military applications. Devices  
are implemented in a silicon gate, two-level metal CMOS  
process, utilizing Actel’s PLICE antifuse technology. This  
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