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A32100DX-1BGG225C PDF预览

A32100DX-1BGG225C

更新时间: 2024-01-08 21:07:02
品牌 Logo 应用领域
ACTEL
页数 文件大小 规格书
22页 217K
描述
Field Programmable Gate Array, 700 CLBs, 10000 Gates, CMOS, PBGA225, BGA-225

A32100DX-1BGG225C 数据手册

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3 2 0 0 D X F i e l d P r o g r a m m a b l e G a t e A r r a y s – T h e S y s t e m L o g i c I n t e g r a t o r ™ F a m i l y  
C lo c k N e t w o r k s  
Two low-skew, high fanout clock distribution networks are  
provided in each 3200DX device. These networks are  
referred to as CLK0 and CLK1. Each network has a clock  
module (CLKMOD) that selects the source of the clock  
signal and may be driven as follows:  
CLKB  
CLKA  
CLKINB  
CLKINA  
FROM  
PADS  
S0  
S1  
INTERNAL  
SIGNAL  
CLKMOD  
1. Externally from the CLKA pad  
2. Externally from the CLKB pad  
3. Internally from the CLKINA input  
4. Internally from the CLKINB input  
CLKO(17)  
CLKO(16)  
CLKO(15)  
CLOCK  
DRIVERS  
The clock modules are located in the top row of I/O modules.  
Clock drivers and a dedicated horizontal clock track are  
located in each horizontal routing channel.  
The user controls the clock module by selecting one of two  
clock macros from the macro library. The macro CLKBUF is  
used to connect one of the two external clock pins to a clock  
network, and the macro CLKINT is used to connect an  
internally generated clock signal to a clock network. Since  
both clock networks are identical, the user does not care  
whether CLK0 or CLK1 is being used. The clock input pads  
may also be used as normal I/Os, bypassing the clock  
networks (see Figure 7).  
CLKO(2)  
CLKO(1)  
CLOCK TRACKS  
Figure 7 Clock Networks  
The 3200DX devices which contain SRAM modules (all  
except A3265DX and A32140DX) have four additional  
register control resources, called Quadrant Clock Networks  
(Figure 8). Each quadrant clock provides a local, high-fanout  
resource to the contiguous logic modules within its quadrant  
of the device. Quadrant clock signals can originate from  
specific I/O pins or from the internal array and can be used as  
a secondary register clock, register clear, or output enable.  
T e s t C ir c u it r y  
The 3200DX provides two modes of device and/or  
board-level testing; JTAG 1149.1 Boundary Scan Testing  
and Actel’s Actionprobe® test facility. Once a 3200DX  
device has been programmed, the Actionprobe test facility  
QCLKA  
QCLKC  
Quad  
Quad  
Clock  
Module  
Clock  
Module  
QCLK1  
QCLK3  
QCLKB  
QCLKD  
*QCLK1IN  
*QCLK3IN  
S0 S1  
S1 S0  
Quad  
Clock  
Quad  
Clock  
QCLK2  
QCLK4  
Module  
Module  
*QCLK2IN  
*QCLK4IN  
S0 S1  
S1 S0  
*QCLK1IN, QCLK2IN, QCLK3IN, and QCKL4IN are internally generated signals.  
Figure 8 Quadrant Clock Network  
7
 
 

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