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9DB306BL PDF预览

9DB306BL

更新时间: 2024-02-20 22:20:52
品牌 Logo 应用领域
艾迪悌 - IDT 驱动光电二极管逻辑集成电路
页数 文件大小 规格书
17页 461K
描述
PLL Based Clock Driver, 9DB Series, 6 True Output(s), 0 Inverted Output(s), PDSO28, 4.40 X 9.70 MM, 0.925 MM HEIGHT, TSSOP-28

9DB306BL 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:SSOP
包装说明:TSSOP,针数:28
Reach Compliance Code:not_compliantECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.86
系列:9DB输入调节:DIFFERENTIAL
JESD-30 代码:R-PDSO-G28JESD-609代码:e0
长度:9.7 mm逻辑集成电路类型:PLL BASED CLOCK DRIVER
湿度敏感等级:1功能数量:1
反相输出次数:端子数量:28
实输出次数:6最高工作温度:70 °C
最低工作温度:封装主体材料:PLASTIC/EPOXY
封装代码:TSSOP封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH峰值回流温度(摄氏度):240
认证状态:Not QualifiedSame Edge Skew-Max(tskwd):0.135 ns
座面最大高度:1.2 mm最大供电电压 (Vsup):3.63 V
最小供电电压 (Vsup):2.97 V标称供电电压 (Vsup):3.3 V
表面贴装:YES温度等级:COMMERCIAL
端子面层:Tin/Lead (Sn85Pb15)端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:20宽度:4.4 mm
Base Number Matches:1

9DB306BL 数据手册

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ICS9DB306 Data Sheet  
PCI EXPRESS JITTER ATTENUATOR  
TYPICAL PHASE NOISE AT 100MHZ  
0
-10  
-20  
-30  
-40  
-50  
-60  
-70  
PCI Express™ Filter  
100MHz  
RMS Phase Jitter (Random)  
1.5MHz to 22MHz = 3ps (typical)  
-80  
-90  
-100  
-110  
-120  
Raw Phase Noise Data  
-130  
-140  
-150  
-160  
-170  
-180  
-190  
Phase Noise Result by adding  
PCI Express™ Filter to raw data  
1k  
10k  
100k  
1M  
10M  
100M  
OFFSET FREQUENCY (HZ)  
The illustrated phase noise plot was taken using a low phase  
noise signal generator, the noise floor of the signal generator is  
less than that of the device under test.  
Due to the tracking ability of a PLL, it will track the input signal up  
to its loop bandwidth.Therefore, if the input phase noise is greater  
than that of the PLL, it will increase the output phase noise  
performance of the device. It is recommended that the phase  
noise performance of the input is verified in order to achieve the  
above phase noise performance.  
Using this configuration allows one to see the true spectral purity  
or phase noise performance of the PLL in the device under test.  
ICS9DB306BL REVISION C MARCH 14, 2012  
5
©2012 Integrated Device Technology, Inc.  

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