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78K0R-LG3 PDF预览

78K0R-LG3

更新时间: 2024-02-28 04:26:11
品牌 Logo 应用领域
瑞萨 - RENESAS 微控制器
页数 文件大小 规格书
1031页 6319K
描述
16-Bit Single-Chip Microcontrollers

78K0R-LG3 数据手册

 浏览型号78K0R-LG3的Datasheet PDF文件第1页浏览型号78K0R-LG3的Datasheet PDF文件第2页浏览型号78K0R-LG3的Datasheet PDF文件第4页浏览型号78K0R-LG3的Datasheet PDF文件第5页浏览型号78K0R-LG3的Datasheet PDF文件第6页浏览型号78K0R-LG3的Datasheet PDF文件第7页 
NOTES FOR CMOS DEVICES  
(1) VOLTAGE APPLICATION WAVEFORM AT INPUT PIN: Waveform distortion due to input noise or a  
reflected wave may cause malfunction. If the input of the CMOS device stays in the area between VIL  
(MAX) and VIH (MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise  
from entering the device when the input level is fixed, and also in the transition period when the input level  
passes through the area between VIL (MAX) and VIH (MIN).  
(2) HANDLING OF UNUSED INPUT PINS: Unconnected CMOS device inputs can be cause of malfunction.  
If an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc.,  
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of  
CMOS devices must be fixed high or low by using pull-up or pull-down circuitry. Each unused pin should be  
connected to VDD or GND via a resistor if there is a possibility that it will be an output pin. All handling  
related to unused pins must be judged separately for each device and according to related specifications  
governing the device.  
(3) PRECAUTION AGAINST ESD: A strong electric field, when exposed to a MOS device, can cause  
destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop  
generation of static electricity as much as possible, and quickly dissipate it when it has occurred.  
Environmental control must be adequate. When it is dry, a humidifier should be used. It is recommended  
to avoid using insulators that easily build up static electricity. Semiconductor devices must be stored and  
transported in an anti-static container, static shielding bag or conductive material. All test and measurement  
tools including work benches and floors should be grounded. The operator should be grounded using a  
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be  
taken for PW boards with mounted semiconductor devices.  
(4) STATUS BEFORE INITIALIZATION: Power-on does not necessarily define the initial status of a MOS  
device. Immediately after the power source is turned ON, devices with reset functions have not yet been  
initialized. Hence, power-on does not guarantee output pin levels, I/O settings or contents of registers.  
A
device is not initialized until the reset signal is received. A reset operation must be executed immediately  
after power-on for devices with reset functions.  
(5) POWER ON/OFF SEQUENCE: In the case of a device that uses different power supplies for the internal  
operation and external interface, as a rule, switch on the external power supply after switching on the internal  
power supply. When switching the power supply off, as a rule, switch off the external power supply and then  
the internal power supply. Use of the reverse power on/off sequences may result in the application of an  
overvoltage to the internal elements of the device, causing malfunction and degradation of internal elements  
due to the passage of an abnormal current. The correct power on/off sequence must be judged separately  
for each device and according to related specifications governing the device.  
(6) INPUT OF SIGNAL DURING POWER OFF STATE : Do not input signals or an I/O pull-up power supply  
while the device is not powered. The current injection that results from input of such a signal or I/O pull-up  
power supply may cause malfunction and the abnormal current that passes in the device at this time may  
cause degradation of internal elements. Input of signals during the power off state must be judged  
separately for each device and according to related specifications governing the device.  

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