Datasheet > 74AHC1G79GW-Q100

74AHC1G79GW-Q100

更新时间： 2022-02-26 11:29:10

品牌	Logo	应用领域
安世 - NEXPERIA		/
页数	文件大小	规格书
14页	721K
描述
Single D-type flip-flop; positive-edge trigger

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74AHC1G79GW-Q100 数据手册

74AHC1G79-Q100;

74AHCT1G79-Q100

Single D-type flip-flop; positive-edge trigger

Rev. 2 — 23 September 2014

Product data sheet

1. General description

74AHC1G79-Q100 and 74AHCT1G79-Q100 are high-speed Si-gate CMOS devices.

They provide a single positive-edge triggered D-type flip-flop.

Information on the data input is transferred to the Q output on the LOW-to-HIGH transition

of the clock pulse. The D input must be stable one set-up time prior to the LOW-to-HIGH

clock transition for predictable operation.

The AHC device has CMOS input switching levels and supply voltage range 2 V to 5.5 V.

The AHCT device has TTL input switching levels and supply voltage range 4.5 V to 5.5 V.

This product has been qualified to the Automotive Electronics Council (AEC) standard

Q100 (Grade 1) and is suitable for use in automotive applications.

2. Features and benefits

 Automotive product qualification in accordance with AEC-Q100 (Grade 1)

 Specified from 40 C to +85 C and from 40 C to +125 C

 Symmetrical output impedance

 High noise immunity

 Low power dissipation

 Balanced propagation delays

 SOT353-1 and SOT753 package options

 ESD protection:

 MIL-STD-883, method 3015 exceeds 2000 V

 HBM JESD22-A114F exceeds 2000 V

 MM JESD22-A115-A exceeds 200 V (C = 200 pf, R = 0 )

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