DS90C031QML
SNLS202B –MARCH 2006–REVISED MARCH 2013
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Table 1. Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Static tests at
Temp (°C)
+25
1
2
Static tests at
+125
-55
3
Static tests at
4
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
+25
5
+125
-55
6
7
+25
8A
8B
9
+125
-55
+25
10
11
12
13
14
+125
-55
+25
+125
-55
(1)
DC Parameters
Sub-
groups
Symbol
Parameter
Conditions
Notes
Min Max
Units
VOD1
Differential Ouput Voltage
RL = 100Ω
250
450
35
mV
mV
1, 2, 3
1, 2, 3
DVOD1
Change in Magnitude of Vod1 for RL = 100Ω
complementary output States
VOS
Offset Voltage
RL = 100Ω
RL = 100Ω
1.12 1.37
V
1, 2, 3
1, 2, 3
5
5
DVOS
Change in Magnitude of Vos for
Complementary Output States
25
mV
VOH
VOL
VIH
VIL
II
Output Voltage High
Output Voltage Low
Input Voltage High
Input Voltage Low
Input Current
RL = 100Ω
RL = 100Ω
1.6
V
V
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
0.9
2.0
(2)
(2)
VCC
0.8
V
Gnd
V
VI = VCC, Gnd, 2.5, or 0.4V
ICl = -18mA
±10
-1.5
-5.0
±10
µA
V
VCl
IOS
IOff
Input Clamp Voltage
Output Short Circuit Current
Power-off Leakage
VO = 0V
mA
µA
VO = 0V or 2.4V,
VCC-= 0V or Open
IOZ
Output TRI-STATE Current
EN = 0.8V and EN* = 2.0V
VO = 0V or VCC
±10
µA
1, 2, 3
ICC
Drivers Enabled Supply Current
Drivers Disabled Supply Current
DI = Hi or Low
25
10
mA
mA
1, 2, 3
1, 2, 3
ICCZ
DI = Hi or Low, En = Gnd,
En* = VCC
(1) Pre and Post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the “Post
Radiation Limits” table. Radiation end point limits for the noted parameters are guaranteed only for the conditions, as specified.
(2) Tested during VOH / VOL tests.
4
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