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5962-89616042C PDF预览

5962-89616042C

更新时间: 2024-02-13 09:32:11
品牌 Logo 应用领域
美信 - MAXIM 转换器
页数 文件大小 规格书
5页 26K
描述
ADC, Successive Approximation, 8-Bit, 1 Func, 1 Channel, Parallel, 8 Bits Access, CMOS, CQCC20, QCC-20

5962-89616042C 技术参数

生命周期:Obsolete包装说明:QCC-20
Reach Compliance Code:unknown风险等级:5.82
Is Samacsys:N最长转换时间:15 µs
转换器类型:ADC, SUCCESSIVE APPROXIMATIONJESD-30 代码:S-CQCC-N20
JESD-609代码:e4最大线性误差 (EL):0.293%
模拟输入通道数量:1位数:8
功能数量:1端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
输出位码:BINARY, OFFSET BINARY, COMPLEMENTARY OFFSET BINARY输出格式:PARALLEL, 8 BITS
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QCCN
封装形状:SQUARE封装形式:CHIP CARRIER
认证状态:Not Qualified标称供电电压:5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:GOLD
端子形式:NO LEAD端子位置:QUAD
Base Number Matches:1

5962-89616042C 数据手册

 浏览型号5962-89616042C的Datasheet PDF文件第1页浏览型号5962-89616042C的Datasheet PDF文件第2页浏览型号5962-89616042C的Datasheet PDF文件第3页浏览型号5962-89616042C的Datasheet PDF文件第4页 
QUALITY ASSURANCE  
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-  
Std-883.  
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:  
1. Test Condition, A, B, C, or D.  
2. TA = +125°C minimum.  
3. Interim and final electrical test requirements shall be specified in Table 2.  
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,  
C, and D inspection.  
Group A inspection:  
1. Tests as specified in Table 2.  
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.  
Group C and D inspections:  
a. End-point electrical parameters shall be specified in Table 1.  
b. Steady-state life test, Method 1005 of Mil-Std-883:  
1. Test condition A, B, C, D.  
2. TA = +125°C, minimum.  
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.  
TABLE 2.  
ELECTRICAL TEST REQUIREMENTS  
Mil-Std-883 Test Requirements  
Subgroups  
per Method 5005, Table 1  
Interim Electric Parameters  
Method 5004  
1
Final Electrical Parameters  
Method 5005  
1*, 2, 3, 4**, 9, 10, 11***  
Group A Test Requirements  
Method 5005  
Group C and D End-Point Electrical Parameters  
Method 5005  
1, 2, 3, 4** , 9, 10, 11***  
1
*
PDA applies to Subgroup 1 only.  
** Subgroups 4, capacitance tests shall be tested at initial qualification and upon redesign.  
*** Subgroups 10 and 11 if not tested, are guaranteed to the limits in Table 1.  
----------------------------  
Electrical Characteristics of MX7574/883B  
for /883B and SMD 5962-89616  
19-0356  
Page 6 of  
Rev. C  
7

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