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5962-87549012X PDF预览

5962-87549012X

更新时间: 2024-01-05 20:42:00
品牌 Logo 应用领域
德州仪器 - TI 输入元件逻辑集成电路
页数 文件大小 规格书
7页 96K
描述
AC SERIES, QUAD 2-INPUT NAND GATE, CQCC20, CERAMIC, LCC-20

5962-87549012X 技术参数

生命周期:Obsolete包装说明:QCCN,
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.76系列:AC
JESD-30 代码:S-CQCC-N20长度:8.89 mm
逻辑集成电路类型:NAND GATE功能数量:4
输入次数:2端子数量:20
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, METAL-SEALED COFIRED封装代码:QCCN
封装形状:SQUARE封装形式:CHIP CARRIER
传播延迟(tpd):7 ns认证状态:Not Qualified
座面最大高度:1.905 mm最大供电电压 (Vsup):6 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:NO LEAD
端子节距:1.27 mm端子位置:QUAD
宽度:8.89 mmBase Number Matches:1

5962-87549012X 数据手册

 浏览型号5962-87549012X的Datasheet PDF文件第2页浏览型号5962-87549012X的Datasheet PDF文件第3页浏览型号5962-87549012X的Datasheet PDF文件第4页浏览型号5962-87549012X的Datasheet PDF文件第5页浏览型号5962-87549012X的Datasheet PDF文件第6页浏览型号5962-87549012X的Datasheet PDF文件第7页 
OBSOLETE  
54AC00, 54ACT00  
www.ti.com  
SNOS076B JULY 2003REVISED APRIL 2013  
54AC00/54ACT00 Quad 2-Input NAND Gate  
Check for Samples: 54AC00, 54ACT00  
1
FEATURES  
DESCRIPTION  
The 'AC/'ACT00 contains four 2-input NAND gates.  
23  
ICC Reduced by 50%  
Outputs Source/Sink 24 mA  
'ACT00 has TTL-Compatible Inputs  
Standard Microcircuit Drawing (SMD)  
'AC00: 5962-87549  
'ACT00: 5962-87699  
54AC00 now Qualified to 300Krad RHA  
Designation, Refer to the SMD for More  
Information  
Logic Symbol  
Figure 1. IEEE/IEC  
Pin Names  
An, Bn  
On  
Description  
Inputs  
Outputs  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
FACT is a registered trademark of Fairchild Semiconductor Corporation.  
2
3
All other trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2003–2013, Texas Instruments Incorporated  

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