Datasheet > 5962-01-420-4926

5962-01-420-4926

更新时间： 2024-02-14 11:31:12

品牌	Logo	应用领域
德州仪器 - TI		/
页数	文件大小	规格书
18页	302K
描述
IC,TIMER,QFP,60PIN,PLASTIC

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5962-01-420-4926 技术参数

是否Rohs认证：	不符合	生命周期：	Obsolete
Reach Compliance Code：	not_compliant	风险等级：	5.92
Is Samacsys：	N	JESD-30 代码：	S-PQFP-G60
端子数量：	60	最高工作温度：	45 °C
最低工作温度：	-20 °C	封装主体材料：	PLASTIC/EPOXY
封装代码：	QFP	封装等效代码：	QFP60,.75SQ,32
封装形状：	SQUARE	封装形式：	FLATPACK
电源：	5 V	认证状态：	Not Qualified
子类别：	Analog Waveform Generation Functions	标称供电电压 (Vsup)：	5 V
表面贴装：	YES	温度等级：	COMMERCIAL
端子形式：	GULL WING	端子节距：	0.8 mm
端子位置：	QUAD	Base Number Matches：	1

5962-01-420-4926 数据手册

SN28837

1/2-INCH PAL TIMER

SOCS031B – JULY 1991

variable-integration-time mode

In addition to the normal TV mode of operation, the SN28837 timing generator offers an optional

variable-integration mode for use with the TC276 and TC277 CCD area-array image sensors. The

variable-integration mode is selected by applying a low-logic level to GPS. This low-logic level disables the

vertical-drive (VD) signal from controlling, internal to the timer, the image-area and storage-area parallel transfer

signal (GP).

Prior to the start of a new integration period, the charge that has accumulated in the image area must be

transferred out. To flush this previous signal or dark-current charge from the image area, GP is pulsed low two

times. Each low pulse generates 302 pulses image-area and storage-area gate and transfer signals that shift

the unwanted charge into the clearing drain. This clearing function should be performed during the high time

of the VD signal (see Figure 3 through Figure 13).

The new integration period continues as long as GP remains high. GPS must be held at a low-logic level to

prevent VD from controlling GP internally. The integration ceases and the readout occurs when VD and GP are

pulsed low simultaneously; this is accomplished by taking GPS to a high-logic level. The readout timing is

dependent on the vertical-drive pulse; this means that the total-integration time is a multiple of 1/50 of a second

plus the time interval between the last GP low pulse and the next VD low pulse. The image readout occurs within

the normal 1/50-second readout interval. If the integration time is less than 1/50 of a second, normal output

operation occurs; if the integration time is greater than 1/50 of a second, a frame buffer may be required to

capture the image.

Integration times greater than 1/50 of a second result in image degradation at temperatures greater than 25°C

due to dark-current generation. The degradation is seen as a decrease in dynamic range (contrast) and an

increase in noise. It is recommended that the image sensor be cooled for long-exposure operation. The

dark-current generation is reduced by a factor of two for each 7°C temperature decrease. The sensor operates

at–30°C. CoolingcanbeaccomplishedbyusingathermoelectricorPeltiercoolerattachedtothe imagesensor.

Condensation on the header must be prevented by isolating the cooled sensor from moist air. Vacuum isolation

is preferred; however, the continual flushing of dry nitrogen across the header can also prevent condensation.

SN28837

C1 ≈ 40 pF

C2 ≈ 40 pF

NOTE: The SN28837 is designed for use with a

crystal oscillator. The X1 and X2

terminals should not connect directly to

external driver outputs.

Figure 2. Connection of an External Crystal Oscillator to the SN28837

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

1 2 3 456 7 8...18

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