5秒后页面跳转
54F13DMQB PDF预览

54F13DMQB

更新时间: 2024-02-18 04:34:40
品牌 Logo 应用领域
美国国家半导体 - NSC 输入元件逻辑集成电路触发器
页数 文件大小 规格书
4页 14K
描述
IC F/FAST SERIES, DUAL 4-INPUT NAND GATE, CDIP24, DIP-24, Gate

54F13DMQB 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:DIP
包装说明:DIP, DIP14,.3针数:24
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.92系列:F/FAST
JESD-30 代码:R-GDIP-T24JESD-609代码:e0
负载电容(CL):50 pF逻辑集成电路类型:NAND GATE
最大I(ol):0.02 A功能数量:2
输入次数:4端子数量:24
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DIP
封装等效代码:DIP14,.3封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT SPECIFIED
电源:5 V最大电源电流(ICC):10 mA
Prop。Delay @ Nom-Sup:22 ns传播延迟(tpd):22 ns
认证状态:Not Qualified施密特触发器:YES
筛选级别:MIL-STD-883座面最大高度:4.572 mm
子类别:Gates最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:NO技术:TTL
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:15.24 mmBase Number Matches:1

54F13DMQB 数据手册

 浏览型号54F13DMQB的Datasheet PDF文件第2页浏览型号54F13DMQB的Datasheet PDF文件第3页浏览型号54F13DMQB的Datasheet PDF文件第4页 
MILITARY DATA SHEET  
Original Creation Date: 03/11/96  
Last Update Date: 07/30/96  
MN54F13-X REV 1A0  
Last Major Revision Date: 03/11/96  
DUAL 4-INPUT NAND SCHMITT TRIGGER  
General Description  
The F13 contains two 4-Input NAND gates which accept standard TTL input signal and provide  
standard TTL output levels. They are capable of transforming slowly changing input  
signals into clearly defined, jitter-free output signals. In addition, they have a  
greater noise margin than conventional NAND gates.  
Each circuit contains a 4-Input Schmitt trigger followed by a Darlington level shifter and  
a phase splitter driving a TTL totem-pole output. The Schmitt trigger uses positive  
feedback to effectively speed-up slow input transistors, and provide different input  
threshold voltages for positive and negative going transitions. This hystersis between  
the positive-going and negative-going input threshold (Typically 800 mV) is determined by  
resistor ratios and is essentially insensitive to temperature and supply voltage  
variations.  
Industry Part Number  
NS Part Numbers  
54F13  
54F13DMQB  
54F13FMQB  
54F13LMQB  
Prime Die  
M013  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

与54F13DMQB相关器件

型号 品牌 描述 获取价格 数据表
54F13FM ROCHESTER NAND Gate, F/FAST Series, 2-Func, 4-Input, TTL, CDFP14, CERAMIC, FP-14

获取价格

54F13FM TI F/FAST SERIES, DUAL 4-INPUT NAND GATE, CDFP14, CERAMIC, FP-14

获取价格

54F13FMQB NSC F/FAST SERIES, DUAL 4-INPUT NAND GATE, CDFP24, DFP-24

获取价格

54F13L1MQB FAIRCHILD NAND Gate, F/FAST Series, 2-Func, 4-Input, TTL, CQCC20, CERAMIC, LCC-20

获取价格

54F13LM TI F/FAST SERIES, DUAL 4-INPUT NAND GATE, CQCC20, CERAMIC, LCC-20

获取价格

54F13LMQB ROCHESTER NAND Gate, F/FAST Series, 2-Func, 4-Input, TTL, CQCC28, LCC-28

获取价格