Datasheet > 54ACTQ32FMQB

54ACTQ32FMQB

更新时间： 2024-01-28 11:58:56

品牌	Logo	应用领域
美国国家半导体 - NSC		栅输入元件
页数	文件大小	规格书
8页	159K
描述
IC ACT SERIES, QUAD 2-INPUT OR GATE, CDFP14, CERAMIC, FP-14, Gate

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54ACTQ32FMQB 技术参数

是否Rohs认证：	不符合	生命周期：	Transferred
包装说明：	DFP, FL14,.3	Reach Compliance Code：	unknown
风险等级：	5.85	JESD-30 代码：	R-XDFP-F14
JESD-609代码：	e0	负载电容（CL）：	50 pF
逻辑集成电路类型：	OR GATE	最大I（ol）：	0.024 A
端子数量：	14	最高工作温度：	125 °C
最低工作温度：	-55 °C	封装主体材料：	CERAMIC
封装代码：	DFP	封装等效代码：	FL14,.3
封装形状：	RECTANGULAR	封装形式：	FLATPACK
包装方法：	TUBE	电源：	5 V
Prop。Delay @ Nom-Sup：	7.5 ns	认证状态：	Not Qualified
施密特触发器：	NO	筛选级别：	38535Q/M;38534H;883B
子类别：	Gates	标称供电电压 (Vsup)：	5 V
表面贴装：	YES	技术：	CMOS
温度等级：	MILITARY	端子面层：	Tin/Lead (Sn/Pb)
端子形式：	FLAT	端子节距：	1.27 mm
端子位置：	DUAL	Base Number Matches：	1

54ACTQ32FMQB 数据手册

FACT Noise Characteristics

The setup of a noise characteristics measurement is critical

to the accuracy and repeatability of the tests. The following

is a brief description of the setup used to measure the noise

characteristics of FACT.

6. Set the word generator input levels at 0V LOW and 3V

HIGH for ACT devices and 0V LOW and 5V HIGH for AC

devices. Verify levels with a digital volt meter.

V /V

OLP OLV

and V

/V :

OHP OHV

Equipment:

Determine the quiet output pin that demonstrates the

greatest noise levels. The worst case pin will usually be

the furthest from the ground pin. Monitor the output volt-

ages using a 50X coaxial cable plugged into a standard

SMB type connector on the test fixture. Do not use an

active FET probe.

Hewlett Packard Model 8180A Word Generator

PC-163A Test Fixture

Tektronics Model 7854 Oscilloscope

Procedure:

1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.

Measure V

and V

OLV

on the quiet output during the

and V on the quiet out-

OLP

HL transition. Measure V

2. Deskew the word generator so that no two channels

have greater than 150 ps skew between them. This re-

quires that the oscilloscope be deskewed first. Swap out

the channels that have more than 150 ps of skew until all

channels being used are within 150 ps. It is important to

deskew the word generator channels before testing. This

will ensure that the outputs switch simultaneously.

OHP

put during the LH transition.

OHV

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

and V

IHD

ILD

3. Terminate all inputs and outputs to ensure proper load-

ing of the outputs and that the input levels are at the

correct voltage.

Monitor one of the switching outputs using a 50X coaxial

cable plugged into a standard SMB type connector on

the test fixture. Do not use an active FET probe.

4. Set V

to 5.0V.

First increase the input LOW voltage level, V , until the

output begins to oscillate. Oscillation is defined as noise

5. Set the word generator to toggle all but one output at a

frequency of 1 MHz. Greater frequencies will increase

DUT heating and affect the results of the measurement.

on the output LOW level that exceeds V limits, or on

output HIGH levels that exceed V limits. The input

LOW voltage level at which oscillation occurs is defined

as V

ILD

Next increase the input HIGH voltage level on the word

generator, V until the output begins to oscillate. Oscilla-

tion is defined as noise on the output LOW level that

exceeds V limits, or on output HIGH levels that exceed

limits. The input HIGH voltage level at which oscilla-

tion occurs is defined as V

IHD

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

TL/F/10893–4

FIGURE 1. Quiet Output Noise Voltage Waveforms

Note A. V

and V

are measured with respect to ground reference.

OLP

OHV

Note B. Input pulses have the following characteristics: f

150 ps.

1 MHz, t

3 ns, t

3 ns, skew

TL/F/10893–5

FIGURE 2. Simultaneous Switching Test Circuit

1 2 345 6 7 8

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