Si540 Data Sheet
Electrical Specifications
Parameter
Symbol
Test Condition/Comment
Mid-level (2.5 V, 3.3 V VDD)
Mid-level (1.8 V VDD)
Swing (diff)
Min
1.125
0.8
Typ
1.20
0.9
0.7
750
0
Max
1.275
1.0
Unit
V
LVDS Output Option4
VOC
V
VO
VOH
VOL
VC
0.5
0.9
VPP
mV
mV
mV
VPP
V
HCSL Output Option5
Output voltage high
Output voltage low
Crossing voltage
660
–150
250
0.6
850
150
350
0.8
—
550
CML Output Option (AC-Coupled)
CMOS Output Option
VO
Swing (diff)
1.0
VOH
VOL
IOH = 8/6/4 mA for 3.3/2.5/1.8V VDD 0.85 × VDD
IOL = 8/6/4 mA for 3.3/2.5/1.8V VDD
—
—
—
0.15 × VDD
V
Notes:
1. Total Stability includes temperature stability, initial accuracy, load pulling, VDD variation, and aging for 20 yrs at 70 ºC.
2. OE includes a 50 kΩ pull-up to VDD for OE active high. Includes a 50 kΩ pull-down to GND for OE active low. NC (No Connect)
pins include a 50 kΩ pull-down to GND.
3. 50 Ω to VDD – 2.0 V.
4. Rterm = 100 Ω (differential).
5. 50 Ω to GND.
Table 2.2. Clock Output Phase Jitter and PSRR
VDD = 1.8 V, 2.5 or 3.3 V ± 5%, TA = –40 to 85 ºC
Parameter
Symbol
Test Condition/Comment
Differential Formats
CMOS, Dual CMOS
Differential Formats
CMOS, Dual CMOS
100 kHz sine wave
200 kHz sine wave
500 kHz sine wave
1 MHz sine wave
Min
—
—
—
—
—
—
—
—
Typ
125
200
150
200
-83
-83
-82
-85
Max
200
—
Unit
fs
Phase Jitter (RMS, 12kHz - 20MHz)1
3.2 x 5 mm, FCLK ≥ 100 MHz
ϕJ
fs
Phase Jitter (RMS, 12kHz - 20MHz)1
5 x 7 mm, FCLK ≥ 100 MHz
200
—
fs
fs
Spurs Induced by External Power Supply
Noise, 50 mVpp Ripple. LVDS 156.25 MHz
Output
PSRR
—
—
dBc
—
—
Note:
1. Guaranteed by characterization. Jitter inclusive of any spurs.
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