ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 3. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Ratings
Symbol
Value
Unit
VDD Supply Voltage (1)
VDD
-0.3 to 7.0
VDC
CS, DI, DO, SCLK, IN5, IN6, and EN (1)
VPWR Supply Voltage (1)
–
VPWR
–
-0.3 to 7.0
-16 to 50
VDC
VDC
VDC
Drain 1–8 (2)
-18 to 40
5.0 mA ≤ IOUT ≤ 0.3 A
Source 1–8 (3)
–
VDC
-28 to 40
5.0 mA ≤ IOUT ≤ 0.3 A
Output Voltage Clamp Low-Side Drive (4)
Output Voltage Clamp High-Side Drive (4)
Output Clamp Energy (5)
VOC
VOC
40 to 55
-15 to -25
50
VDC
VDC
mJ
V
ECLAMP
ESD Voltage (6)
Human Body Model
Machine Model
VESD1
VESD2
±2000
±200
Storage Temperature
TSTG
TC
TJ
-55 to 150
-40 to 125
-40 to 150
-40 to 150
°C
°C
°C
°C
W
Operating Case Temperature
Operating Junction Temperature
Maximum Junction Temperature
–
Power Dissipation (TA = 25°C) (7)
PD
1.3
1.7
28 SOIC, Case 751F-05
32 SOIC, Case 1324-02
Thermal Resistance, Junction-to-Ambient, 28 SOIC, Case 751F-05
RθJA
94
°C/W
°C/W
Thermal Resistance, Junction-to-Ambient, 32 SOIC, Case 1324-02
RθJA
RθJL
70
18
Thermal Resistance, Junction-to-Thermal Ground Leads, 32 SOIC, Case 1324-02
(6)
Peak Package Reflow Temperature During Reflow (5)
,
TPPRT
Note 6
°C
Notes
1. Exceeding these limits may cause malfunction or permanent damage to the device.
2. Configured as low-side driver with 300 mA load as current limit.
3. Configured as high-side driver with 300 mA load as current limit.
4. With outputs OFF and 10 mA of test current for low-side driver, 30 mA test current for high-side driver.
5. Maximum output clamp energy capability at 150°C junction temperature using single non-repetitive pulse method.
6. ESD1 testing is performed in accordance with the Human Body Model (CZAP = 100 pF, RZAP = 1500 Ω), and ESD2 testing is performed
in accordance with the Machine Model (CZAP = 200 pF, RZAP = 0 Ω).
7. Maximum power dissipation with no heatsink used.
33880
Analog Integrated Circuit Device Data
Freescale Semiconductor
5