28F200BX-T/B, 28F002BX-T/B
Revision History
Number
Description
b
Removed 70 speed bin
-002
b
b
Integrated 70 characteristics into 60 speed bin
Added Extended Temperature characteristics
Ý
Modified BYTE Timing Diagram
Improved t
specifications
Ý
, RP High to Output Delay and t
Ý Ý
, RP High Recovery to CE going low
PHEL
PHQV
Ý
-003
PWD changed to RP for JEDEC standardization compatibility.
Combined V Read current for 28F200BX Word-wide mode and Byte-wide mode, and
CC
28F002BX Byte-wide mode in DC Characteristics tables.
g g
current spec from 10 mA to 15 mA in DC Characteristics tables.
Change I
PPS
Improved I
Improved t
and I
in DC Characteristics: Extended Temperature Operation table.
CCW
CCR
, t
, t
, t
, t
, t
, t
and t
specifications for
FLQZ
Extended Temperature Operations AC CharacteristicsÐRead and Write Operations.
AVAV AVQV ELQV GLQV EHQZ GHQZ FHQV
-004
Added specifications for 120 ns access time product version; 28F200BX-120 and
28F002BX-120.
Included permanent change on write timing parameters for -80 ns product versions. Write
pulse width (t
t
and t ) increases from 50 ns to 60 ns. Write pulse width high (t
CP
) decreases from 30 ns to 20 ns. Total write cycle time (t ) remains unchanged.
WC
and
WP
WPH
CPH
Added I
Added I
test condition note for typical frequency value in DC characteristics table.
CMOS specification.
CCR
OH
Added 28F400BX interface to Intel386TMEX Embedded Processor block diagram.
Added description of how to upgrade to SmartVoltage Boot Block products.
-005
Added references to input rise/fall times.
48