Datasheet > 2600-TLINK

2600-TLINK

更新时间： 2022-02-26 11:08:35

品牌	Logo	应用领域
泰克 - TEKTRONIX		/
页数	文件大小	规格书
13页	995K
描述
2606B System SourceMeter SMU Instrument

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2600-TLINK 数据手册

2606B System SourceMeter^®SMU Instrument

2606B Front Panel

Digital I/O

LAN

USB-Device

TSP-Link

USB-Host

2606B Rear Panel

Analog I/O

Typical Applications

I-V functional test and characterization of a wide

range of devices, including:

• Optoelectronic devices

– Vertical cavity surface emitting

lasers (VCSELs), laser diodes

(used on 3D sensing systems)

– High brightness (HBLEDs), light-

emitting diodes (LEDs)

– Displays

2606B SMU instruments are easily racked and stacked in a rack system

with minimum rail depth of 27 inches (0.686 m).

• Integrated devices small scale

integrated (SSI) and large scale

integrated (LSI)

Third-generation SMU Instrument Design

Ensures Faster Test Times

– Analog ICs

– Radio frequency integrated

circuits (RFICs)

Based on the proven architecture of the Series 2600B

instruments, the 2606B’s SMU instrument design

enhances test speed in several ways. For example, the

2606B uses a patented series ranging topology that

provides faster and smoother range changes and outputs

that settle more quickly.

– Application speciﬁc integrated

circuits (ASICs)

– System on a chip (SOC) devices

• Discrete and passive components

–

Two-leaded sensors, disk drive

heads, metal oxide varistors

(MOVs), diodes, zener diodes,

sensors, capacitors, thermistors

The 2606B SMU instrument design supports two

modes of operation for use with a variety of loads.

In normal mode, the SMU instrument provides high

bandwidth performance for maximum throughput. In high

capacitance (high-C) mode, the SMU instrument uses

a slower bandwidth to provide robust performance with

higher capacitive loads.

– Three-leaded small signal bipolar

junction transistors (BJTs), ﬁeld-

effect transistors (FETs), and more

• Simple ICs optos, drivers, switches, sensors,

converters, regulators

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