X5R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
X5R Specification Limits
Measuring Conditions
Temperature Cycle Chamber
-11ºC to +81ºC
Within specified tolerance
≤ 2.15 for ≥ 10V DC rating
≤ 3.05 for 21V DC rating
Freq.: ±.0 kHz ± ±05
Voltage: ±.0Vrms ± .2V
For Cap > ±0 μF, 0.1Vrms @ ±20Hz
Dissipation Factor
≤ ±2.15 Max. for ±6V DC rating and lower
Contact Factory for DF by PN
±0,000MΩ or 100MΩ - μF,
whichever is less
Charge device with rated voltage for
±20 ± 1 secs @ room temp/humidity
Charge device with 3005 of rated voltage for
±-1 seconds, w/charge and discharge current
limited to 10 mA (max)
Insulation Resistance
Dielectric Strength
No breakdown or visual defects
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
No defects
≤ ±±25
Deflection: 2mm
Test Time: 30 seconds
Resistance to
Flexure
1mm/sec
Meets Initial Values (As Above)
≥ Initial Value x 0.3
Stresses
90 mm
≥ 915 of each terminal should be covered
with fresh solder
No defects, <215 leaching of either end terminal
Dip device in eutectic solder at 230 ± 1ºC
for 1.0 ± 0.1 seconds
Solderability
Appearance
Capacitance
Variation
≤ ±7.15
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Resistance to
Solder Heat
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±7.15
Appearance
Capacitance
Variation
Step ±: -11ºC ± 2º
Step 2: Room Temp
30 ± 3 minutes
≤ 3 minutes
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Thermal
Shock
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +81ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
Repeat for 1 cycles and measure after
24 ± 2 hours at room temperature
Charge device with ±.1X rated voltage in
test chamber set at 81ºC ± 2ºC for ±000 hours
(+48, -0). Note: Contact factory for *optional
specification part numbers that are tested at
< ±.1X rated voltage.
Meets Initial Values (As Above)
No visual defects
≤ ±±2.15
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Load Life
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Meets Initial Values (As Above)
No visual defects
Store in a test chamber set at 81ºC ± 2ºC/
815 ± 15 relative humidity for ±000 hours
(+48, -0) with rated voltage applied.
≤ ±±2.15
Load
Humidity
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
25
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