X5R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
X5R Specification Limits
-55ºC to +85ºC
Withinꢀspecifiedꢀtolerance
Measuring Conditions
Temperature Cycle Chamber
Freq.:ꢀ1.0ꢀkHzꢀ±ꢀ10%ꢀ
Voltage: 1.0Vrms ± .2V
ForꢀCapꢀ>ꢀ10ꢀµF,ꢀ0.5Vrmsꢀ@ꢀ120Hz
≤ꢀ2.5%ꢀforꢀ≥ꢀ50VꢀDCꢀrating
≤ꢀ12.5%ꢀforꢀ25V,ꢀ35VꢀDCꢀrating
≤ꢀ12.5%ꢀMax.ꢀforꢀ16VꢀDCꢀratingꢀandꢀlower
ContactꢀFactoryꢀforꢀDFꢀbyꢀPN
Dissipation Factor
10,000MΩꢀorꢀ500MΩꢀ-ꢀµF,
Charge device with rated voltage for 120 ± 5
Insulation Resistance
Dielectric Strength
whichever is less
secsꢀ@ꢀroomꢀtemp/humidity
Charge device with 250% of rated voltage for 1-5
seconds,ꢀw/chargeꢀandꢀdischargeꢀcurrentꢀlimitedꢀ
to 50 mA (max)
Noꢀbreakdownꢀorꢀvisualꢀdefects
Appearance
Capacitance
Variation
No defects
Deflection:ꢀ2mm
Test Time: 30 seconds
≤ꢀ±12%
Resistance to
Flexure
Stresses
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ꢀInitialꢀValueꢀxꢀ0.3
≥ꢀ95%ꢀofꢀeachꢀterminalꢀshouldꢀbeꢀcoveredꢀwithꢀ
Dip device in eutectic solder at 230 ± 5ºC for 5.0
± 0.5 seconds
Solderability
fresh solder
Appearance
Noꢀdefects,ꢀ<25%ꢀleachingꢀofꢀeitherꢀendꢀterminal
≤ꢀ±7.5%
Capacitance
Variation
Dissipation
Dip device in eutectic solder at 260ºC for
60seconds. Store at room temperature for 24 ±
2hours before measuring electrical properties.
Resistance to
Solder Heat
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Meets Initial Values (As Above)
No visual defects
≤ꢀ±7.5%
Step 1: -55ºC ± 2º
30 ± 3 minutes
Capacitance
Variation
Step 2: Room Temp
≤ꢀ3ꢀminutes
Dissipation
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +85ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
Thermal Shock
Factor
Insulation
Resistance
≤ꢀ3ꢀminutes
Dielectric
Strength
Appearance
Capacitance
Variation
Repeat for 5 cycles and measure after 24 ± 2
hours at room temperature
Meets Initial Values (As Above)
No visual defects
Charge device with 1.5X rated voltage in test
chamber set at 85ºC ± 2ºC for 1000 hours
(+48,ꢀ-0).
≤ꢀ±12.5%
Dissipation
≤ꢀInitialꢀValueꢀxꢀ2.0ꢀ(SeeꢀAbove)
≥ꢀInitialꢀValueꢀxꢀ0.3ꢀ(SeeꢀAbove)
Note:ꢀContactꢀfactoryꢀforꢀ*optionalꢀspecificationꢀ
partꢀnumbersꢀthatꢀareꢀtestedꢀatꢀ<ꢀ1.5Xꢀratedꢀ
voltage.
Factor
Load Life
Insulation
Resistance
Removeꢀfromꢀtestꢀchamberꢀandꢀstabilizeꢀatꢀroomꢀ
Dielectric
Strength
Meets Initial Values (As Above)
temperature for 24 ± 2 hours
Appearance
No visual defects
Capacitance
Variation
≤ꢀ±12.5%
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5%ꢀrelativeꢀhumidityꢀforꢀ1000ꢀhoursꢀ(+48,ꢀ-0)ꢀwithꢀ
rated voltage applied.
Dissipation
Factor
≤ꢀInitialꢀValueꢀxꢀ2.0ꢀ(SeeꢀAbove)
≥ꢀInitialꢀValueꢀxꢀ0.3ꢀ(SeeꢀAbove)
Meets Initial Values (As Above)
Load
Humidity
Removeꢀfromꢀchamberꢀandꢀstabilizeꢀatꢀroomꢀ
temperature and humidity for
Insulation
Resistance
24 ± 2 hours before measuring.
Dielectric
Strength
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
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