MLCC with FLEXITERM®
Specifications and Test Methods
BOARD BEND TEST PROCEDURE
PERFORMANCE TESTING
According to AEC-Q200
AEC-Q200 Qualification:
• Created by the Automotive Electronics
Council
Test Procedure as per AEC-Q200:
Sample size:
Span: 90mm
20 components
LOADING
KNIFE
Minimum deflection spec: 2 mm
• Specification defining stress
test qualification for
passive components
• Components soldered onto FR4 PCB (Figure 1)
• Board connected electrically to the test equipment
(Figure 2)
MOUNTING
ASSEMBLY
DIGITAL
CALIPER
Testing:
BEND TESTPLATE
Key tests used to compare
soft termination to
AEC-Q200 qualification:
• Bend Test
CONNECTOR
CONTROL
PANEL
CONTROL PANEL
• Temperature Cycle Test
Fig 2 - Board Bend test
equipment
Fig 1 - PCB layout with electrical connections
BOARD BEND TEST RESULTS
AEC-Q200 Vrs AVX FLEXITERM® Bend Test
0603
0805
12
10
8
6
4
2
12
10
8
6
4
2
AVX ENHANCED SOFT
TERMINATION BEND TEST
PROCEDURE
0
0
NPO
X7R
X7R soft term
NPO
X7R
X7R soft term
Bend Test
The capacitor is soldered to the printed circuit
board as shown and is bent up to 10mm at
1mm per second:
1210
1206
12
10
8
12
10
8
6
4
2
0
6
4
2
0
Max. = 10mm
NPO
X7R
X7R soft term
NPO
X7R
X7R soft term
TABLE SUMMARY
90mm
Typical bend test results are shown below:
Style
0603
0805
1206
Conventional Termination
FLEXITERM®
>5mm
>2mm
>2mm
>2mm
• The board is placed on 2 supports 90mm
apart (capacitor side down)
• The row of capacitors is aligned with the
load stressing knife
>5mm
>5mm
TEMPERATURE CYCLE TEST PROCEDURE
Test Procedure as per AEC-Q200:
Max. = 10mm
The test is conducted to determine the resistance of the
component when it is exposed to extremes of alternating
high and low temperatures.
• Sample lot size quantity 77 pieces
• TC chamber cycle from -55ºC to +125ºC for 1000 cycles
• Interim electrical measurements at 250, 500, 1000 cycles
• Measure parameter capacitance dissipation factor,
insulation resistance
• The load is applied and the deflection where
the part starts to crack is recorded (Note:
Equipment detects the start of the crack
using a highly sensitive current detection
circuit)
Test Temperature Profile (1 cycle)
+1250
+250
C
C
• The maximum deflection capability is 10mm
-550
C
1 hour 12mins
47