Datasheet > 1117R10M00000BX

1117R10M00000BX

更新时间： 2023-02-15 00:00:00

品牌	Logo	应用领域
美高森美 - MICROSEMI		/
页数	文件大小	规格书
22页	453K
描述
TTL Output Clock Oscillator, 10MHz Nom, PLASTIC, J LEADED PACKAGE-4

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1117R10M00000BX 数据手册

a. Design Pedigree (choose one as the 5^thcharacter in the part number):

(E) Enhanced Element Evaluation, 100krad Class S die, Premium Q Swept Quartz

(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz

(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz

(X) Hi-Rel design w/ Cultured Quartz, Class S die

(B) Hi-Rel design w/ Swept Quartz, Class B die

(D) Hi-Rel design w/ Cultured Quartz and commercial grade components

b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14^thcharacter

c. Frequency-Temperature Slew Test

d. Radiographic Inspection

e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)

f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)

g. Internal Water-Vapor Content (RGA) samples and test performance

h. MTBF Reliability Calculations

i. Worst Case/Derating Analysis

j. Deliverable Process Identification Documentation (PID)

k. Customer Source Inspection (pre-cap / final)

5.3

5.4

Test Conditions. Unless otherwise stated herein, inspections are performed in accordance with

those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process travelers

identify the applicable methods, conditions and procedures to be used. Examples of electrical

test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 3.

Special Tests and Descriptions.

5.4.1 Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as an

indicator of higher than normal internal water vapor content. The incremental temperature

sweep from +125°C to -55°C and back to +125°C records output frequency fluctuations

emulating the mass loading of moisture deposited on the crystal blank surface. Though not

replacing a customer’s internal water-vapor content (RGA) requirement, confidence is

increased without destructively testing otherwise good devices.

5.4.2 Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in delta

measurements is performed at the crystal’s upper turning point temperature where its effects on

repeatable frequency accuracy are maximized. Dependent on the crystal specified, this

temperature is typically between +65°C and +85°C, 0.2°C.

5.5

Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lot

of devices:

a. Completed assembly and screening lot travelers, including rework history.

b. Electrical test variables data, identified by unique serial number.

c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA data as

required by purchase order.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

1...4 5 678 9 10...22

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型号	品牌	描述	获取价格	数据表
1117R12M00000BX	MICROSEMI	TTL Output Clock Oscillator, 12MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格
1117R24M00000AA	MICROSEMI	TTL Output Clock Oscillator, 24MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格
1117R24M00000AB	MICROSEMI	TTL Output Clock Oscillator, 24MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格
1117R24M00000AD	MICROSEMI	TTL Output Clock Oscillator, 24MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格
1117R24M00000AF	MICROSEMI	TTL Output Clock Oscillator, 24MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格
1117R24M00000AX	MICROSEMI	TTL Output Clock Oscillator, 24MHz Nom, PLASTIC, J LEADED PACKAGE-4	获取价格

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