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1106V100M00000AD PDF预览

1106V100M00000AD

更新时间: 2024-02-01 18:32:25
品牌 Logo 应用领域
美高森美 - MICROSEMI 机械振荡器
页数 文件大小 规格书
22页 453K
描述
ACMOS Output Clock Oscillator, 100MHz Nom, PLASTIC, CERAMIC PACKAGE-20

1106V100M00000AD 技术参数

生命周期:TransferredReach Compliance Code:compliant
风险等级:5.65最长下降时间:3 ns
频率调整-机械:NO频率稳定性:50%
JESD-609代码:e4安装特点:THROUGH HOLE MOUNT
标称工作频率:100 MHz最高工作温度:125 °C
最低工作温度:-55 °C振荡器类型:ACMOS
输出负载:10 KOHM, 15 pF物理尺寸:12.19mm x 12.19mm x 2.97mm
最长上升时间:3 ns标称供电电压:5 V
表面贴装:NO最大对称度:60/40 %
端子面层:GOLDBase Number Matches:1

1106V100M00000AD 数据手册

 浏览型号1106V100M00000AD的Datasheet PDF文件第3页浏览型号1106V100M00000AD的Datasheet PDF文件第4页浏览型号1106V100M00000AD的Datasheet PDF文件第5页浏览型号1106V100M00000AD的Datasheet PDF文件第7页浏览型号1106V100M00000AD的Datasheet PDF文件第8页浏览型号1106V100M00000AD的Datasheet PDF文件第9页 
4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated  
after 15 days if the measured aging rate is less than half of the specified aging rate. This is a  
common method of expediting 30-Day Aging without incurring risk to the hardware and used  
quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations  
of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally  
conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.  
Vectron’s automated aging systems take about 6 data points per day, so a lot of data is  
available to do very accurate projections, much more data than what is required by MIL-PRF-  
55310. The delivered data would include the Aging plots projected to 30 days. If the units  
would not perform within that limit then they would continue to full 30 Day term. Please  
advise by purchase order text if this may be an acceptable option to exercise as it assists in  
Production Test planning.  
4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the device  
frequency and are in accordance with Tables 2 and 2A. Waveform measurement points and  
logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.  
4.3.6 Output Load. Standard TTL (6 or 10) and ACMOS (10k, 15pF) test loads are in accordance  
with MIL-PRF-55310.  
5.  
QUALITY ASSURANCE PROVISIONS AND VERIFICATION  
5.1  
Verification and Test. Device lots shall be tested prior to delivery in accordance with the  
applicable Screening Option letter as stated by the 15th character of the part number. Table 5  
tests are conducted in the order shown and annotated on the appropriate process travelers and  
data sheets of the governing test procedure. For devices that require Screening Options that  
include MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group A  
Electrical Test are combined into one operation.  
5.1.1 Screening Options. The Screening Options, by letter, are summarized as:  
A
B
Modified MIL-PRF-38534 Class K  
Modified MIL-PRF-55310 Class B Screening & Group A Quality Conformance  
Inspection (QCI)  
C
D
E
F
Modified MIL-PRF-55310 Class S Screening & Group A QCI  
Modified MIL-PRF-38534 Class K with Burn-in Delta Aging  
Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI  
Modified MIL-PRF-55310 Class S Screening, Groups A & B QCI  
Modified MIL-PRF-55310 Class B Screening & Post Burn-in Nominal  
Electricals  
G
X
Engineering Model (EM)  
5.2  
Optional Design, Test and Data Parameters. The following is a list of design, assembly,  
inspection and test options that can be selected or added by purchase order request.  
CODE IDENT NO.  
UNSPECIFIED TOLERANCES  
SIZE  
DWG NO.  
REV.  
SHEET  
A
00136  
N/A  
OS-68338  
K
6

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