Datasheet > 1106V0M35000AD

1106V0M35000AD

更新时间： 2023-04-15 00:00:00

品牌	Logo	应用领域
美高森美 - MICROSEMI		/
页数	文件大小	规格书
22页	453K
描述
ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20

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1106V0M35000AD 数据手册

4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated

after 15 days if the measured aging rate is less than half of the specified aging rate. This is a

common method of expediting 30-Day Aging without incurring risk to the hardware and used

quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations

of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally

conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.

Vectron’s automated aging systems take about 6 data points per day, so a lot of data is

available to do very accurate projections, much more data than what is required by MIL-PRF-

55310. The delivered data would include the Aging plots projected to 30 days. If the units

would not perform within that limit then they would continue to full 30 Day term. Please

advise by purchase order text if this may be an acceptable option to exercise as it assists in

Production Test planning.

4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the device

frequency and are in accordance with Tables 2 and 2A. Waveform measurement points and

logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.

4.3.6 Output Load. Standard TTL (6 or 10) and ACMOS (10kΩ, 15pF) test loads are in accordance

with MIL-PRF-55310.

QUALITY ASSURANCE PROVISIONS AND VERIFICATION

5.1

Verification and Test. Device lots shall be tested prior to delivery in accordance with the

applicable Screening Option letter as stated by the 15^thcharacter of the part number. Table 5

tests are conducted in the order shown and annotated on the appropriate process travelers and

data sheets of the governing test procedure. For devices that require Screening Options that

include MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group A

Electrical Test are combined into one operation.

5.1.1 Screening Options. The Screening Options, by letter, are summarized as:

Modified MIL-PRF-38534 Class K

Modified MIL-PRF-55310 Class B Screening & Group A Quality Conformance

Inspection (QCI)

Modified MIL-PRF-55310 Class S Screening & Group A QCI

Modified MIL-PRF-38534 Class K with Burn-in Delta Aging

Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI

Modified MIL-PRF-55310 Class S Screening, Groups A & B QCI

Modified MIL-PRF-55310 Class B Screening & Post Burn-in Nominal

Electricals

Engineering Model (EM)

5.2

Optional Design, Test and Data Parameters. The following is a list of design, assembly,

inspection and test options that can be selected or added by purchase order request.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

1...3 4 567 8 9...22

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与1106V0M35000AD相关器件

型号	品牌	描述	获取价格	数据表
1106V0M35000AE	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格
1106V0M35000AF	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格
1106V0M35000BA	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格
1106V0M35000BB	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格
1106V0M35000BD	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格
1106V0M35000BE	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Nom, PLASTIC, CERAMIC PACKAGE-20	获取价格

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