Datasheet > 1103XFREQ1BG

1103XFREQ1BG

更新时间： 2023-05-15 00:00:00

品牌	Logo	应用领域
美高森美 - MICROSEMI		/
页数	文件大小	规格书
22页	453K
描述
ACMOS Output Clock Oscillator, 0.35MHz Min, 12MHz Max, PLASTIC, FLAT PACKAGE-16

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in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part

of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for

Class 1 devices.

3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to

this document. Inspection conditions and standards are documented in accordance with the

Quality Assurance, ISO-9001 derived, System of QSP-90100.

3.4.5 Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to

eliminate costs associated with the development/maintenance of device-specific documentation

packages while maintaining performance integrity.

3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.

3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see ¶ 5.2) use the

same robust designs found in the other device pedigrees. They do not include the provisions of

traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.

DETAIL REQUIREMENTS

Components

4.1

4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the

devices. The optional use of Premium Q swept quartz can, because of its processing to remove

impurities, be specified for better frequency aging characteristics. In accordance with MIL-

PRF-55310, the manufacturer has a documented crystal element evaluation program.

4.1.2 Passive Components. Established Reliability (ER) failure level R minimum passive

components are procured from QPL suppliers. Lot evaluations are in accordance with MIL-

PRF-55310 or Enhanced Element Evaluation as specified in Table 7.

4.1.3 Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-

55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS

classification in accordance with MIL-PRF-38535. When optionally specified, further testing

in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness

assurance and for Enhanced Element Evaluation as specified in Table 6. Those microcircuits,

identified by a unique part number, are certified for 100krad(Si) total ionizing dose (TID),

RHA level R (2X minimum margin). NSC, as the original 54ACT designer, rates the SEU

LET at >40 MeV and SEL at >120MeV for the FACT™ family (AN-932). Vectron has

conducted additional SEE testing in 2008 to verify this performance since our lot wafer testing

does not include these parameters and determinations.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

1 2 345 6 7...22

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与1103XFREQ1BG相关器件

型号	品牌	描述	获取价格	数据表
1103XFREQ1BX	MICROSEMI	ACMOS Output Clock Oscillator, 0.35MHz Min, 12MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格
1103XFREQ2AB	MICROSEMI	ACMOS Output Clock Oscillator, 12MHz Min, 100MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格
1103XFREQ2AC	MICROSEMI	ACMOS Output Clock Oscillator, 12MHz Min, 100MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格
1103XFREQ2AX	MICROSEMI	ACMOS Output Clock Oscillator, 12MHz Min, 100MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格
1103XFREQ2BB	MICROSEMI	ACMOS Output Clock Oscillator, 12MHz Min, 100MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格
1103XFREQ2BE	MICROSEMI	ACMOS Output Clock Oscillator, 12MHz Min, 100MHz Max, PLASTIC, FLAT PACKAGE-16	获取价格

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