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1103XFREQ1BA PDF预览

1103XFREQ1BA

更新时间: 2024-01-08 04:56:15
品牌 Logo 应用领域
美高森美 - MICROSEMI 机械振荡器
页数 文件大小 规格书
22页 453K
描述
ACMOS Output Clock Oscillator, 0.35MHz Min, 12MHz Max, PLASTIC, FLAT PACKAGE-16

1103XFREQ1BA 技术参数

生命周期:ActiveReach Compliance Code:compliant
风险等级:5.69最长下降时间:6 ns
频率调整-机械:NO频率稳定性:50%
JESD-609代码:e4安装特点:THROUGH HOLE MOUNT
最大工作频率:12 MHz最小工作频率:0.35 MHz
最高工作温度:125 °C最低工作温度:-55 °C
振荡器类型:ACMOS输出负载:10 KOHM, 15 pF
物理尺寸:12.83mm x 9.78mm x 3.0mm最长上升时间:6 ns
标称供电电压:3.3 V表面贴装:NO
最大对称度:55/45 %端子面层:GOLD
Base Number Matches:1

1103XFREQ1BA 数据手册

 浏览型号1103XFREQ1BA的Datasheet PDF文件第4页浏览型号1103XFREQ1BA的Datasheet PDF文件第5页浏览型号1103XFREQ1BA的Datasheet PDF文件第6页浏览型号1103XFREQ1BA的Datasheet PDF文件第8页浏览型号1103XFREQ1BA的Datasheet PDF文件第9页浏览型号1103XFREQ1BA的Datasheet PDF文件第10页 
a. Design Pedigree (choose one as the 5th character in the part number):  
(E) Enhanced Element Evaluation, 100krad Class S die, Premium Q Swept Quartz  
(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz  
(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz  
(X) Hi-Rel design w/ Cultured Quartz, Class S die  
(B) Hi-Rel design w/ Swept Quartz, Class B die  
(C) Hi-Rel design w/ Cultured Quartz, Class B die  
(D) Hi-Rel design w/ Cultured Quartz and commercial grade components  
b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14th character  
c. Frequency-Temperature Slew Test  
d. Radiographic Inspection  
e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)  
f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)  
g. Internal Water-Vapor Content (RGA) samples and test performance  
h. MTBF Reliability Calculations  
i. Worst Case/Derating Analysis  
j. Deliverable Process Identification Documentation (PID)  
k. Customer Source Inspection (pre-cap / final)  
5.3  
5.4  
Test Conditions. Unless otherwise stated herein, inspections are performed in accordance with  
those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process travelers  
identify the applicable methods, conditions and procedures to be used. Examples of electrical  
test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 3.  
Special Tests and Descriptions.  
5.4.1 Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as an  
indicator of higher than normal internal water vapor content. The incremental temperature  
sweep from +125°C to -55°C and back to +125°C records output frequency fluctuations  
emulating the mass loading of moisture deposited on the crystal blank surface. Though not  
replacing a customer’s internal water-vapor content (RGA) requirement, confidence is  
increased without destructively testing otherwise good devices.  
5.4.2 Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in delta  
measurements is performed at the crystal’s upper turning point temperature where its effects on  
repeatable frequency accuracy are maximized. Dependent on the crystal specified, this  
temperature is typically between +65°C and +85°C, 0.2°C.  
5.5  
Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lot  
of devices:  
a. Completed assembly and screening lot travelers, including rework history.  
b. Electrical test variables data, identified by unique serial number.  
c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA data as  
required by purchase order.  
CODE IDENT NO.  
UNSPECIFIED TOLERANCES  
SIZE  
DWG NO.  
REV.  
SHEET  
A
00136  
N/A  
OS-68338  
K
7

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