100398QIX

更新时间： 2024-02-28 21:11:53

品牌	Logo	应用领域
飞兆/仙童 - FAIRCHILD		转换器锁存器接口集成电路
页数	文件大小	规格书
13页	120K
描述
ECL-to-TTL Translator

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技术参数
数据手册

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100398QIX 技术参数

生命周期：	Contact Manufacturer	包装说明：	QCCJ,
Reach Compliance Code：	unknown	ECCN代码：	EAR99
HTS代码：	8542.39.00.01	风险等级：	5.78
最大延迟：	5.8 ns	接口集成电路类型：	TTL TO ECL TRANSCEIVER
JESD-30 代码：	S-PQCC-J28	长度：	11.43 mm
位数：	1	功能数量：	4
端子数量：	28	最高工作温度：	85 °C
最低工作温度：	-40 °C	输出特性：	3-STATE
输出锁存器或寄存器：	LATCH	输出极性：	COMPLEMENTARY
封装主体材料：	PLASTIC/EPOXY	封装代码：	QCCJ
封装形状：	SQUARE	封装形式：	CHIP CARRIER
座面最大高度：	4.57 mm	最大供电电压：	5.5 V
最小供电电压：	4.5 V	标称供电电压：	5 V
表面贴装：	YES	技术：	ECL
温度等级：	INDUSTRIAL	端子形式：	J BEND
端子节距：	1.27 mm	端子位置：	QUAD
宽度：	11.43 mm	Base Number Matches：	1

100398QIX 数据手册

Absolute Maximum Ratings(Note 5)

Recommended Operating

Conditions

Storage Temperature (T_STG

)

−65°C to +150°C

Maximum Junction Temperature

(T_J)

Case Temperature (T_C)

Commercial

+150°C

−7.0V to +0.5V

−0.5V to +6.0V

0°C to +85°C

−40°C to +85°C

−5.7V to −4.2V

+4.5V to +5.5V

V_EEPin Potential to Ground Pin

V_TTLPin Potential to Ground Pin

ECL Input Voltage (DC)

ECL Output Current

Industrial

ECL Supply Voltage (V_EE

)

V_EEto +0.5V

TTL Supply Voltage (V_TTL

)

(DC Output HIGH)

−50 mA

TTL Input Voltage (Note 6)

TTL Input Current (Note 6)

Voltage Applied to Output in

HIGH State 3-STATE Output

Current Applied to TTL

Output in LOW State (Max)

ESD (Note 7)

−0.5V to +7.0V

−30 mA to +5.0 mA

Note 5: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

−0.5V to +5.5V

twice the Rated I_OL(mA)

≥ 2000V

Note 6: The specified limits represent the “worst case” value for the param-

eter. Since these values normally occur at the temperature extremes, addi-

tional noise immunity and guardbanding can be achieved by decreasing the

allowable system operating ranges. Conditions for testing shown in the

tables are chosen to guarantee operation under “worst case” conditions.

Note 7: ESD testing conforms to MIL-STD-883, Method 3015.

Commercial Version

TTL-to-ECL DC Electrical Characteristics ^{(Note 9)}

_EE= −4.2V to −5.7V, GND = 0V, T_C= 0°C to +85°C, V_TTL= +4.5V to +5.5V

Symbol

Parameter

Min

Typ

Max

Units

Conditions

V_OH

V_OL

Output HIGH Voltage

−1025

−1830

−955

−870

_IN= V_IH(Max)or V_IL(Min)

Output LOW Voltage

Cutoff Voltage

−1705

−2000

−1620

−1950

Loading with 50Ω to − 2V

OE and LE LOW, DIR HIGH

V_IN= V_IH(Max)or V_IL(Min),

Loading with 50Ω to −2V

V_OHC

Output HIGH Voltage

Corner Point High

Output LOW Voltage

Corner Point Low

Input HIGH Voltage

Input LOW Voltage

Input HIGH Current

Breakdown Test

−1035

V_IN= V_IH(Min)or V_IL(Max)

V_OLC

Loading with 50Ω to −2V

−1610

V_IH

V_IL

I_IH

2.0

5.0

0.8

5.0

0.5

Over V_TTL, V_EE, T_CRange

µA

V_IN= +2.7V

V_IN= +5.5V

V_IN= +0.5V

I_IL

Input LOW Current

Input Clamp

−700

−1.2

−99

V_FCD

I_IN= −18 mA

Diode Voltage

I_EE

V_EESupply Current

−50

−90

LE LOW, OE and DIR HIGH

Inputs Open

I_EEZ

V_EESupply Current

−159

LE and OE LOW, DIR HIGH

Inputs Open

Note 8: Either voltage limit or current limit is sufficient to protect inputs.

Note 9: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

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