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0805Y1000561FCT PDF预览

0805Y1000561FCT

更新时间: 2024-02-05 19:13:22
品牌 Logo 应用领域
楼氏 - KNOWLES 电容器
页数 文件大小 规格书
6页 553K
描述
CAP CER 560PF 100V C0G/NP0 0805

0805Y1000561FCT 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active包装说明:CHIP
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8532.24.00.20风险等级:5.16
电容:0.00056 µF电容器类型:CERAMIC CAPACITOR
介电材料:CERAMIC高度:1.3 mm
JESD-609代码:e3长度:2 mm
安装特点:SURFACE MOUNT多层:Yes
负容差:1%端子数量:2
最高工作温度:125 °C最低工作温度:-55 °C
封装形式:SMT包装方法:TR, Embossed Plastic, 7 Inch
正容差:1%额定(直流)电压(URdc):100 V
尺寸代码:0805表面贴装:YES
温度特性代码:C0G温度系数:30ppm/Cel ppm/ °C
端子面层:Matte Tin (Sn) - with Nickel (Ni) barrier端子形状:WRAPAROUND
宽度:1.25 mmBase Number Matches:1

0805Y1000561FCT 数据手册

 浏览型号0805Y1000561FCT的Datasheet PDF文件第1页浏览型号0805Y1000561FCT的Datasheet PDF文件第2页浏览型号0805Y1000561FCT的Datasheet PDF文件第3页浏览型号0805Y1000561FCT的Datasheet PDF文件第5页浏览型号0805Y1000561FCT的Datasheet PDF文件第6页 
Ageing of Ceramic Capacitors  
Tight Tolerance  
Capacitor ageing is a term used to describe the negative,  
logarithmic capacitance change which takes place in ceramic  
capacitors with time. The crystalline structure for barium  
titanate based ceramics changes on passing through its Curie  
temperature (known as the Curie Point) at about 125ºC. The  
domain structure relaxes with time and in doing so, the  
dielectric constant reduces logarithmically; this is known as the  
ageing mechanism of the dielectric constant. The more stable  
dielectrics have the lowest ageing rates.  
One of the advantages of Syfer’s unique ‘wet process’ of  
manufacture is the ability to offer capacitors with exceptionally  
tight capacitance tolerances.  
The accuracy of the printing screens used in the fully  
automated, computer controlled manufacturing process allows  
for tolerance as close as ± 1% on C0G/NP0 parts greater than  
or equal to 10pF. For capacitance value less than 4.7pF  
tolerances can be as tight as ± 0.05pF.  
The ageing process is reversible and repeatable. Whenever the  
capacitor is heated to a temperature above the Curie Point the  
ageing process starts again from zero.  
Periodic Tests Conducted and Reliability Data  
For standard surface mount capacitors components are  
randomly selected on a sample basis and the following routine  
tests conducted:  
The ageing constant, or ageing rate, is defined as the  
percentage loss of capacitance due to the ageing process of  
the dielectric which occurs during a decade of time (a tenfold  
increase in age) and is expressed as percent per logarithmic  
decade of hours. As the law of decrease of capacitance is  
logarithmic, this means that for a capacitor with an ageing rate  
of 1% per decade of time, the capacitance will decrease at a  
rate of:  
Load Test. 1,000 hours @ 125˚C (150˚C for X8R).  
Applied voltage depends on components tested  
Humidity Test. 168 hours @ 85˚C/85%RH  
Board Deflection (bend test)  
a) 1% between 1 and 10 hours  
Test results are available on request.  
b) An additional 1% between the following 10 and 100  
hours  
Conversion Factors  
From  
FITs  
FITs  
To  
Operation  
109 ÷ FITs  
c) An additional 1% between the following 100 and 1000  
hours  
MTBF (hours)  
MTBF (years)  
d) An additional 1% between the following 1000 and  
10000 hours  
109 ÷ (FITs × 8760)  
e) The ageing rate continues in this manner throughout  
the capacitor’s life.  
FIT = Failures In Time. 1 FIT = 1 failure in 109 hours  
MTBF = Mean Time Between Failure  
Typical values of the ageing constant for our MLCCs are  
Dielectric Class  
Ultra Stable C0G/NP0  
Stable X7R  
Typical Values  
Example of FIT Data Available  
Negligible capacitance loss  
through ageing  
<2% per decade of time  
Capacitance Measurements  
Because of ageing it is necessary to specify an age for  
reference measurements at which the capacitance shall be  
within the prescribed tolerance. This is fixed at 1000 hours,  
since for all practical purposes there is not much further loss of  
capacitance after this time.  
All capacitors shipped are within their specified tolerance at the  
standard reference age of 1000 hours after having cooled  
through their Curie temperature.  
Component type:  
Testing Location:  
Results based on:  
0805 (C0G/NP0 and X7R)  
Syfer reliability test department  
16,622,000 component test hours  
The ageing curve for any ceramic dielectric is a straight line  
when plotted on semi-log paper.  
Capacitance vs. Time  
(Ageing X7R @ 1% per decade)  
© Knowles 2014  
StandardMLCCDatasheet Issue 4 (P109801) Release Date 04/11/14  
Page 4 of 6  
Tel: +44 1603 723300 | Email SyferSales@knowles.com | www.knowlescapacitors.com/syfer  

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