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08051J0R5BBS PDF预览

08051J0R5BBS

更新时间: 2022-05-14 22:22:25
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恩智浦 - NXP /
页数 文件大小 规格书
25页 1134K
描述
Gallium Arsenide pHEMT RF Power Field Effect Transistor

08051J0R5BBS 数据手册

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Document Number: MRFG35010AN  
Rev. 4, 8/2013  
Freescale Semiconductor  
Technical Data  
Gallium Arsenide pHEMT  
RF Power Field Effect Transistor  
Designed for WLL/MMDS/BWA or UMTS driver applications. Characterized  
from 500 to 5000 MHz. Device is unmatched and is suitable for use in Class AB  
customer premise equipment (CPE) applications.  
MRFG35010ANT1  
Typical Single--Carrier W--CDMA Performance: VDD = 12 Vdc, IDQ = 130 mA,  
3.84 MHz Channel Bandwidth, Input Signal PAR = 8.5 dB @ 0.01%  
Probability on CCDF.  
500--5000 MHz, 9 W, 12 V  
POWER FET  
GaAs pHEMT  
Frequency  
(MHz)  
P
(W)  
G
ACPR  
(dBc)  
D
IRL  
(dB)  
out  
ps  
(dB)  
14.5  
13.0  
11.5  
(%)  
24.0  
25.0  
30.0  
750  
2140  
2650  
1
--44.0  
--43.0  
--43.0  
-- 1 5  
-- 1 4  
-- 1 5  
1
1
Features  
9 Watts P1dB @ 3550 MHz, CW  
Excellent Phase Linearity and Group Delay Characteristics  
High Efficiency and High Linearity  
PLD--1.5  
PLASTIC  
In Tape and Reel. T1 Suffix = 1000 Units, 16 mm Tape Width, 13--inch Reel.  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Vdc  
Vdc  
dBm  
C  
Drain--Source Voltage  
Gate--Source Voltage  
RF Input Power  
V
15  
-- 5  
DSS  
V
GS  
P
33  
in  
Storage Temperature Range  
T
stg  
--65 to +150  
175  
(1)  
Channel Temperature  
T
ch  
C  
Table 2. Thermal Characteristics  
(2)  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
R
6.5  
C/W  
JC  
Case Temperature 77C, 1 W CW  
Table 3. ESD Protection Characteristics  
Test Methodology  
Class  
Human Body Model (per JESD22--A114)  
Machine Model (per EIA/JESD22--A115)  
Charge Device Model (per JESD22--C101)  
Table 4. Moisture Sensitivity Level  
Test Methodology  
2
A
IV  
Rating  
Package Peak Temperature  
Unit  
Per JESD22--A113, IPC/JEDEC J--STD--020  
3
260  
C  
1. For reliable operation, the operating channel temperature should not exceed 150C.  
2. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.  
Select Documentation/Application Notes -- AN1955.  
Freescale Semiconductor, Inc., 2006, 2008--2009, 2012--2013. All rights reserved.  

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