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08051C103KAZ2A PDF预览

08051C103KAZ2A

更新时间： 2024-02-10 04:08:03
品牌 Logo 应用领域
安华高科 - AVAGO /
页数 文件大小 规格书
4页 81K
描述
X7R Dielectric

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08051C103KAZ2A 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Active零件包装代码：0805
包装说明：CHIPReach Compliance Code：compliant
ECCN代码：EAR99HTS代码：8532.24.00.20
Factory Lead Time：12 weeks风险等级：0.8
电容：0.01 µF电容器类型：CERAMIC CAPACITOR
介电材料：CERAMIC高度：0.94 mm
JESD-609代码：e3长度：2.01 mm
安装特点：SURFACE MOUNT多层：Yes
负容差：10%端子数量：2
最高工作温度：125 °C最低工作温度：-55 °C
封装形状：RECTANGULAR PACKAGE封装形式：SMT
包装方法：TR, PAPER, 7 INCH正容差：10%
额定（直流）电压（URdc）：100 V参考标准：AEC-Q200
尺寸代码：0805表面贴装：YES
温度特性代码：X7R温度系数：15% ppm/ °C
端子面层：Matte Tin (Sn) - with Nickel (Ni) barrier端子形状：WRAPAROUND
宽度：1.25 mmBase Number Matches：1

08051C103KAZ2A 数据手册

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X7R Dielectric  
Specifications and Test Methods  
Parameter/Test  
Operating Temperature Range  
Capacitance  
X7R Specification Limits  
Measuring Conditions  
Temperature Cycle Chamber  
-11ºC to +±21ºC  
Within specified tolerance  
≤ 2.15 for ≥ 10V DC rating  
≤ 3.05 for 21V DC rating  
≤ 3.15 for ±6V DC rating  
≤ 1.05 for ≤ ±0V DC rating  
±00,000MΩ or ±000MΩ - μF,  
whichever is less  
Freq.: ±.0 kHz ± ±05  
Voltage: ±.0Vrms ± .2V  
For Cap > ±0 μF, 0.1Vrms @ ±20Hz  
Dissipation Factor  
Charge device with rated voltage for  
±20 ± 1 secs @ room temp/humidity  
Charge device with 3005 of rated voltage for  
±-1 seconds, w/charge and discharge current  
limited to 10 mA (max)  
Insulation Resistance  
Dielectric Strength  
No breakdown or visual defects  
Note: Charge device with ±105 of rated  
voltage for 100V devices.  
Appearance  
Capacitance  
Variation  
Dissipation  
Factor  
No defects  
Deflection: 2mm  
Test Time: 30 seconds  
≤ ±±25  
Resistance to  
Flexure  
1mm/sec  
Meets Initial Values (As Above)  
Stresses  
Insulation  
Resistance  
≥ Initial Value x 0.3  
90 mm  
≥ 915 of each terminal should be covered  
with fresh solder  
No defects, <215 leaching of either end terminal  
Dip device in eutectic solder at 230 ± 1ºC  
for 1.0 ± 0.1 seconds  
Solderability  
Appearance  
Capacitance  
Variation  
≤ ±7.15  
Dip device in eutectic solder at 260ºC for 60  
seconds. Store at room temperature for 24 ± 2  
hours before measuring electrical properties.  
Dissipation  
Factor  
Insulation  
Resistance  
Dielectric  
Strength  
Resistance to  
Solder Heat  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
No visual defects  
≤ ±7.15  
Appearance  
Capacitance  
Variation  
Step ±: -11ºC ± 2º  
Step 2: Room Temp  
30 ± 3 minutes  
≤ 3 minutes  
Dissipation  
Factor  
Insulation  
Resistance  
Dielectric  
Strength  
Appearance  
Capacitance  
Variation  
Dissipation  
Factor  
Insulation  
Resistance  
Dielectric  
Strength  
Appearance  
Capacitance  
Variation  
Dissipation  
Factor  
Insulation  
Resistance  
Dielectric  
Strength  
Thermal  
Shock  
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Step 3: +±21ºC ± 2º  
Step 4: Room Temp  
30 ± 3 minutes  
≤ 3 minutes  
Repeat for 1 cycles and measure after  
24 ± 2 hours at room temperature  
Meets Initial Values (As Above)  
No visual defects  
Charge device with ±.1 rated voltage (≤ ±0V) in  
test chamber set at ±21ºC ± 2ºC  
for ±000 hours (+48, -0)  
≤ ±±2.15  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
Load Life  
Remove from test chamber and stabilize  
at room temperature for 24 ± 2 hours  
before measuring.  
Meets Initial Values (As Above)  
No visual defects  
Store in a test chamber set at 81ºC ± 2ºC/  
815 ± 15 relative humidity for ±000 hours  
(+48, -0) with rated voltage applied.  
≤ ±±2.15  
Load  
Humidity  
≤ Initial Value x 2.0 (See Above)  
≥ Initial Value x 0.3 (See Above)  
Meets Initial Values (As Above)  
Remove from chamber and stabilize at  
room temperature and humidity for  
24 ± 2 hours before measuring.  
17  
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