5秒后页面跳转
02013A100GAT2A PDF预览

02013A100GAT2A

更新时间: 2024-02-26 09:37:34
品牌 Logo 应用领域
京瓷/艾维克斯 - KYOCERA AVX 电容器固定电容器PC
页数 文件大小 规格书
4页 88K
描述
C0G (NP0) Dielectric General Specifications

02013A100GAT2A 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:0201
包装说明:CHIPReach Compliance Code:compliant
ECCN代码:EAR99HTS代码:8532.24.00.20
Factory Lead Time:12 weeks风险等级:5.32
Samacsys Confidence:5Samacsys Status:Released
2D Presentation:https://componentsearchengine.com/2D/0T/833500.1.1.pngSchematic Symbol:https://componentsearchengine.com/symbol.php?partID=833500
PCB Footprint:https://componentsearchengine.com/footprint.php?partID=8335003D View:https://componentsearchengine.com/viewer/3D.php?partID=833500
Samacsys PartID:833500Samacsys Image:https://componentsearchengine.com/Images/9/02013A100GAT2A.jpg
Samacsys Thumbnail Image:https://componentsearchengine.com/Thumbnails/1/02013A100GAT2A.jpgSamacsys Pin Count:2
Samacsys Part Category:CapacitorSamacsys Package Category:Capacitor Chip Non-polarised
Samacsys Footprint Name:AVX0201Samacsys Released Date:2017-07-24 15:18:26
Is Samacsys:N电容:0.00001 µF
电容器类型:CERAMIC CAPACITOR介电材料:CERAMIC
高度:0.33 mmJESD-609代码:e3
长度:0.6 mm安装特点:SURFACE MOUNT
多层:Yes负容差:2%
端子数量:2最高工作温度:125 °C
最低工作温度:-55 °C封装形状:RECTANGULAR PACKAGE
封装形式:SMT包装方法:TR, PAPER, 7 INCH
正容差:2%额定(直流)电压(URdc):25 V
尺寸代码:0201表面贴装:YES
温度特性代码:C0G温度系数:30ppm/Cel ppm/ °C
端子面层:Tin (Sn) - with Nickel (Ni) barrier端子形状:WRAPAROUND
宽度:0.3 mmBase Number Matches:1

02013A100GAT2A 数据手册

 浏览型号02013A100GAT2A的Datasheet PDF文件第1页浏览型号02013A100GAT2A的Datasheet PDF文件第3页浏览型号02013A100GAT2A的Datasheet PDF文件第4页 
C0G (NP0) Dielectric  
Specifications and Test Methods  
Parameter/Test  
Operating Temperature Range  
Capacitance  
NP0 Specification Limits  
Measuring Conditions  
emperature Cycle Chamber  
ꢃreq.: 1.0 MHz ± 10ꢁ for cap ꢆ 1000 pꢃ  
1.0 kHz ± 10ꢁ for cap ꢇ 1000 pꢃ  
Voltage: 1.0Vrms ± .2V  
-55ºC to +125ºC  
Within specified tolerance  
ꢄ±0 pꢃ: Qꢅ 400+20 x Cap Value  
ꢅ±0 pꢃ: Qꢅ 1000  
Q
100,000MΩ or 1000MΩ - μ,  
whichever is less  
Charge device with rated voltage for  
60 ± 5 secs ꢈ room tempꢀhumidity  
Charge device with ±00ꢁ of rated voltage for  
1-5 seconds, wꢀcharge and discharge current  
limited to 50 mA (max)  
Insulation Resistance  
Dielectric Strength  
No breakdown or visual defects  
Note: Charge device with 150ꢁ of rated  
voltage for 500V devices.  
Appearance  
Capacitance  
Variation  
No defects  
Deflection: 2mm  
est ꢂime: ±0 seconds  
±5ꢁ or ±.5 p, whichever is greater  
Resistance to  
Flexure  
1mm/sec  
Q
Meets Initial Values (As Above)  
ꢅ Initial Value x 0.±  
Stresses  
Insulation  
Resistance  
90 mm  
ꢅ 95ꢁ of each terminal should be covered  
with fresh solder  
No defects, ꢄ25ꢁ leaching of either end terminal  
Dip device in eutectic solder at 2±0 ± 5ºC  
for 5.0 ± 0.5 seconds  
Solderability  
Appearance  
Capacitance  
Variation  
ꢆ ±2.5ꢁ or ±.25 p, whichever is greater  
Dip device in eutectic solder at 260ºC for 60  
seconds. Store at room temperature for 24 ± 2  
hours before measuring electrical properties.  
Resistance to  
Solder Heat  
Q
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Insulation  
Resistance  
Dielectric  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
Step 1: -55ºC ± 2º  
Step 2: Room emp  
±0 ± ± minutes  
ꢆ ± minutes  
ꢆ ±2.5ꢁ or ±.25 p, whichever is greater  
Thermal  
Shock  
Q
Meets Initial Values (As Above)  
Meets Initial Values (As Above)  
Step ±: +125ºC ± 2º  
Step 4: Room emp  
±0 ± ± minutes  
ꢆ ± minutes  
Insulation  
Resistance  
Dielectric  
Repeat for 5 cycles and measure after  
24 hours at room temperature  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
ꢆ ±±.0ꢁ or ± .± p, whichever is greater  
Charge device with twice rated voltage in  
test chamber set at 125ºC ± 2ºC  
for 1000 hours (+48, -0).  
ꢅ ±0 pꢃ:  
ꢅ10 p, ±0 pꢃ:  
ꢄ10 pꢃ:  
Qꢅ ±50  
Qꢅ 275 +5Cꢀ2  
Qꢅ 200 +10C  
Q
Load Life  
(C=Nominal Cap)  
Insulation  
Resistance  
Dielectric  
Remove from test chamber and stabilize at  
room temperature for 24 hours  
before measuring.  
ꢅ Initial Value x 0.± (See Above)  
Meets Initial Values (As Above)  
No visual defects  
Strength  
Appearance  
Capacitance  
Variation  
ꢆ ±5.0ꢁ or ± .5 p, whichever is greater  
Store in a test chamber set at 85ºC ± 2ºCꢀ  
85ꢁ ± 5ꢁ relative humidity for 1000 hours  
(+48, -0) with rated voltage applied.  
ꢅ ±0 pꢃ:  
ꢅ10 p, ±0 pꢃ:  
ꢄ10 pꢃ:  
Qꢅ ±50  
Qꢅ 275 +5Cꢀ2  
Qꢅ 200 +10C  
Load  
Q
Humidity  
Insulation  
Resistance  
Dielectric  
Strength  
Remove from chamber and stabilize at  
room temperature for 24 ± 2 hours  
before measuring.  
ꢅ Initial Value x 0.± (See Above)  
Meets Initial Values (As Above)  
5

与02013A100GAT2A相关器件

型号 品牌 描述 获取价格 数据表
02013A100GAT4A KYOCERA AVX Ceramic Capacitor, Multilayer, Ceramic, 25V, 2% +Tol, 2% -Tol, C0G, 30ppm/Cel TC, 0.00001u

获取价格

02013A100GAT7A KYOCERA AVX Ceramic Capacitor, Multilayer, Ceramic, 25V, 2% +Tol, 2% -Tol, C0G, 30ppm/Cel TC, 0.00001u

获取价格

02013A100GAT9A KYOCERA AVX Ceramic Capacitor, Multilayer, Ceramic, 25V, 2% +Tol, 2% -Tol, C0G, 30ppm/Cel TC, 0.00001u

获取价格

02013A100JAQ2A KYOCERA AVX C0G (NP0) Dielectric General Specifications

获取价格

02013A100JAT2A KYOCERA AVX C0G (NP0) Dielectric General Specifications

获取价格

02013A100JAT4A KYOCERA AVX NP0 MLCC

获取价格