Multilayer Ceramic Capacitors
Approval Sheet
9. RELIABILITY TEST CONDITIONS AND REQUIREMENTS
No.
Item
Test Condition
Requirements
1. Visual and
Mechanical
---
* No remarkable defect.
* Dimensions to conform to individual specification sheet.
2. Capacitance
Class I: NP0
* Shall not exceed the limits given in the detailed spec.
Cap≤1000pF, 0.5~5Vrms, 1MHz±10%
Cap>1000pF, 1.0±0.2Vrms, 1KHz±10%
Class II: , X7R & X5R(≥10V)
3. Q/ D.F.
(Dissipation
Factor)
* NP0: Cap≥30pF, Q≥1000; Cap<30pF, Q≥400+20C
X7R: ≤5.0 %
X5R: ≤10 %
1.0±0.2Vrms, 1KHz±10%
Class II: , X5R(≤6.3V)
0.5±0.2Vrms, 1kHz±10%
*Before initial measurement (Class II only): To apply de-aging
at 150°C for 1hr then set for 24±2 hrs at room temp .
* To apply voltage (≤100V) 250%.
* Duration: 1 to 5 sec.
4. Dielectric
Strength
* No evidence of damage or flash over during test.
* Charge and discharge current less than 50mA.
5. Insulation
Resistance
To apply rated voltage for max. 120 sec.
* NP0, X7R: ≥10GΩ or RxC≥500Ω-F whichever is smaller.
X5R: RxC≥50Ω-F
6. Temperature
Coefficient
With no electrical load.
T.C.
NPO
X7R
X5R
Operating Temp
-55~125°C at 25°C
-55~125°C at 25°C
-55~ 85°C at 25°C
T.C.
NPO
X7R
X5R
Capacitance Change
Within ±30ppm/°C
Within ±15%
Within ±15%
*Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
*Measurement voltage for Class II
Cap≤0.01µF: 0.5V
Cap>0.01µF: 0.2V
7. Adhesive
Strength of
Termination
* Pressurizing force：1N
* No remarkable damage or removal of the terminations.
* Test time: 10±1 sec.
8. Vibration
Resistance
* Vibration frequency: 10~55 Hz/min.
* Total amplitude: 1.5mm
* No remarkable damage.
* Cap change and Q/D.F.: To meet initial spec.
* Test time: 6 hrs. (Two hrs each in three mutually
perpendicular directions.)
* Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
* Cap./DF(Q) Measurement to be made after de-aging at
150°C for 1hr then set for 24±2 hrs at room temp.
9. Solderability
* Solder temperature: 235±5°C
* Dipping time: 2±0.5 sec.
95% min. coverage of all metalized area.
10. Bending Test * The middle part of substrate shall be pressurized by means * No remarkable damage.
of the pressurizing rod at a rate of about 1 mm per second until * Cap change:
the deflection becomes 1 mm and then the pressure shall be
maintained for 5±1 sec.
NP0: within ±5.0% or ±0.5pF whichever is larger.
X7R: within ±12.5%
* Before initial measurement (Class II only):
To apply de-aging at 150°C for 1hr then set for 24± 2 hrs at
room temp.
X5R: within ±25.0%
(This capacitance change means the change of capacitance under
specified flexure of substrate from the capacitance measured before
the test.)
* Measurement to be made after keeping at room temp. for
24±2 hrs.
Page 5 of 8
ASC_Ultra Small_(01R5)_026F_AS
Dec. 2018
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