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W39L020Q-90B PDF预览

W39L020Q-90B

更新时间: 2024-11-05 22:10:51
品牌 Logo 应用领域
华邦 - WINBOND 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
19页 239K
描述
128K X 8 CMOS FLASH MEMORY

W39L020Q-90B 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:TSOP包装说明:TSSOP, TSSOP32,.56,20
针数:32Reach Compliance Code:unknown
ECCN代码:EAR99HTS代码:8542.32.00.51
风险等级:5.92Is Samacsys:N
最长访问时间:90 ns启动块:BOTTOM/TOP
命令用户界面:YES数据轮询:YES
耐久性:10000 Write/Erase CyclesJESD-30 代码:R-PDSO-G32
JESD-609代码:e0长度:12.4 mm
内存密度:2097152 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
部门数/规模:4端子数量:32
字数:262144 words字数代码:256000
工作模式:ASYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:256KX8
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装等效代码:TSSOP32,.56,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH页面大小:4K words
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
电源:3.3 V编程电压:3.3 V
认证状态:Not Qualified座面最大高度:1.2 mm
部门规模:64K最大待机电流:0.00005 A
子类别:Flash Memories最大压摆率:0.02 mA
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:COMMERCIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED切换位:YES
类型:NOR TYPE宽度:8 mm
Base Number Matches:1

W39L020Q-90B 数据手册

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W29EE012  
´ 8 CMOS FLASH MEMORY  
128K  
GENERAL DESCRIPTION  
The W29EE012 is a 1-megabit, 5-volt only CMOS flash memory organized as 128K ´ 8 bits. The  
device can be programmed and erased in-system with a standard 5V power supply. A 12-volt VPP is  
not required. The unique cell architecture of the W29EE012 results in fast program/erase operations  
with extremely low current consumption (compared to other comparable 5-volt flash memory products).  
The device can also be programmed and erased using standard EPROM programmers.  
FEATURES  
· Single 5-volt program and erase operations  
· Fast page-write operations  
· Low power consumption  
- Active current: 25 mA (typ.)  
- Standby current: 20 mA (typ.)  
- 128 bytes per page  
- Page program cycle: 10 mS (max.)  
- Effective byte-program cycle time: 39 mS  
- Optional software-protected data write  
· Fast chip-erase operation: 50 mS  
· Page program/erase cycles: 1,000  
· Ten-year data retention  
· Automatic program timing with internal VPP  
generation  
· End of program detection  
- Toggle bit  
- Data polling  
· Latched address and data  
· TTL compatible I/O  
· JEDEC standard byte-wide pinouts  
· Software and hardware data protection  
Publication Release Date: March 26, 2002  
- 1 -  
Revision A3  

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