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W29C020S-70 PDF预览

W29C020S-70

更新时间: 2024-11-19 22:41:27
品牌 Logo 应用领域
华邦 - WINBOND 闪存存储内存集成电路光电二极管
页数 文件大小 规格书
21页 267K
描述
256K X 8 CMOS FLASH MEMORY

W29C020S-70 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
零件包装代码:SOIC包装说明:SOP, SOP32,.56
针数:32Reach Compliance Code:not_compliant
ECCN代码:EAR99HTS代码:8542.32.00.51
风险等级:5.88Is Samacsys:N
最长访问时间:70 ns其他特性:128 BYTE PAGE WRITE; DATA RETENTION= 10 YEARS
启动块:BOTTOM/TOP命令用户界面:NO
数据轮询:YES数据保留时间-最小值:10
耐久性:1000 Write/Erase CyclesJESD-30 代码:R-PDSO-G32
JESD-609代码:e0长度:20.45 mm
内存密度:2097152 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
部门数/规模:1,1,1端子数量:32
字数:262144 words字数代码:256000
工作模式:ASYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:256KX8
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装等效代码:SOP32,.56封装形状:RECTANGULAR
封装形式:SMALL OUTLINE并行/串行:PARALLEL
峰值回流温度(摄氏度):NOT SPECIFIED电源:5 V
编程电压:5 V认证状态:Not Qualified
座面最大高度:3 mm部门规模:8K,240K,8K
最大待机电流:0.0001 A子类别:Flash Memories
最大压摆率:0.05 mA最大供电电压 (Vsup):5.25 V
最小供电电压 (Vsup):4.75 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
切换位:YES类型:NOR TYPE
宽度:11.3 mmBase Number Matches:1

W29C020S-70 数据手册

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W29C020  
256K ´ 8 CMOS FLASH MEMORY  
GENERAL DESCRIPTION  
The W29C020 is a 2-megabit, 5-volt only CMOS flash memory organized as 256K ´ 8 bits. The  
device can be written (erased and programmed) in-system with a standard 5V power supply. A 12-volt  
VPP is not required. The unique cell architecture of the W29C020 results in fast write (erase/program)  
operations with extremely low current consumption compared to other comparable 5-volt flash  
memory products. The device can also be written (erased and programmed) by using standard  
EPROM programmers.  
FEATURES  
· Single 5-volt write (erase and program)  
operations  
· Software and hardware data protection  
· Low power consumption  
· Fast page-write operations  
- 128 bytes per page  
- Active current: 25 mA (typ.)  
- Standby current: 20 mA (typ.)  
- Page write (erase/program) cycle: 10 mS  
(max.)  
· Automatic write (erase/program) timing with  
internal VPP generation  
- Effective byte-write (erase/program) cycle  
time: 39 mS  
· End of write (erase/program) detection  
- Toggle bit  
- Optional software-protected data write  
· Fast chip-erase operation: 50 mS  
· Two 8 KB boot blocks with lockout  
- Data polling  
· Latched address and data  
· All inputs and outputs directly TTL compatible  
· JEDEC standard byte-wide pinouts  
· Typical page write (erase/program) cycles:  
100/1K/10K  
· Available packages: 32-pin 600 mil DIP, 450 mil  
SOP, TSOP, and 32-pin PLCC  
· Read access time: 70/90/120 nS  
· Ten-year data retention  
Publication Release Date: February 1998  
- 1 -  
Revision A3  

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