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V62/07646-01XE PDF预览

V62/07646-01XE

更新时间: 2024-11-05 11:06:43
品牌 Logo 应用领域
德州仪器 - TI 放大器光电二极管比较器
页数 文件大小 规格书
8页 346K
描述
增强型产品双路差分比较器 | D | 8 | -55 to 125

V62/07646-01XE 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:SOIC
包装说明:SOIC-8针数:8
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:6 weeks
风险等级:0.8放大器类型:COMPARATOR
最大平均偏置电流 (IIB):0.05 µA25C 时的最大偏置电流 (IIB):0.25 µA
最大输入失调电压:9000 µVJESD-30 代码:R-PDSO-G8
JESD-609代码:e4长度:4.9 mm
湿度敏感等级:1功能数量:2
端子数量:8最高工作温度:125 °C
最低工作温度:-55 °C输出类型:OPEN-COLLECTOR
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:TR峰值回流温度(摄氏度):260
认证状态:Not Qualified标称响应时间:1300 ns
座面最大高度:1.75 mm子类别:Comparator
最大压摆率:0.5 mA供电电压上限:36 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:BIPOLAR温度等级:MILITARY
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:3.9 mm
Base Number Matches:1

V62/07646-01XE 数据手册

 浏览型号V62/07646-01XE的Datasheet PDF文件第2页浏览型号V62/07646-01XE的Datasheet PDF文件第3页浏览型号V62/07646-01XE的Datasheet PDF文件第4页浏览型号V62/07646-01XE的Datasheet PDF文件第5页浏览型号V62/07646-01XE的Datasheet PDF文件第6页浏览型号V62/07646-01XE的Datasheet PDF文件第7页 
LM293-EP  
DUAL DIFFERENTIAL COMPARATOR  
www.ti.com  
SLCS155OCTOBER 2007  
1
FEATURES  
Controlled Baseline  
Low Supply-Current Drain Independent of  
Supply Voltage . . . 0.4 mA Typical Per  
Comparator  
One Assembly  
Test Site  
Low Input Bias Current . . . 25 nA Typical  
Low Input Offset Voltage . . . 2 mV Typical  
One Fabrication Site  
Extended Temperature Performance of  
–55°C to 125°C  
Common-Mode Input Voltage Range Includes  
Ground  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
Differential Input Voltage Range Equal to  
Maximum-Rated Supply Voltage . . . ±36 V  
Enhanced Product Change Notification  
Low Output Saturation Voltage  
(1)  
Qualification Pedigree  
Output Compatible With TTL, MOS, and CMOS  
Single Supply or Dual Supplies  
Wide Range of Supply Voltage  
LM293 . . . D PACKAGE  
(TOP VIEW)  
Max Rating . . . 2 V to 36 V  
Tested to 30 V  
1OUT  
1IN–  
1IN+  
GND  
VCC  
1
2
3
4
8
7
6
5
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
2OUT  
2IN–  
2IN+  
electromigration, bond intermetallic life, and mold-compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION/ORDERING INFORMATION  
This device consist of two independent voltage comparators that are designed to operate from a single power  
supply over a wide range of voltages. Operation from dual supplies also is possible as long as the difference  
between the two supplies is 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode  
voltage. Current drain is independent of the supply voltage. The outputs can be connected to other  
open-collector outputs to achieve wired-AND relationships.  
The LM293-EP is characterized for operation from –55°C to 125°C.  
ORDERING INFORMATION(1)  
VIOmax  
AT 25°C  
TA  
MAX VCC  
30 V  
PACKAGE(2)  
ORDERABLE PART NUMBER  
TOPSIDE MARKING  
LM293E  
–55°C to 125°C 5 mV  
SOIC – D Reel of 2500 LM293MDREP  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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