PCM4104-EP
www.ti.com
SBAS419–JUNE 2007
High-Performance, 24-Bit, 216-kHz Sampling, Four-Channel Audio
Digital-to-Analog Converter
FEATURES
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256 Steps with 0.5 dB per Step
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Controlled Baseline
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Output Phase Inversion (Software Mode Only)
Zero Data Mute (Software Mode Only)
Audio Serial Port
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One Assembly/Test Site, One Fabrication
Site
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Extended Temperature Performance of –40°C
to 85°C
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Supports Left-Justified, Right-Justified,
I2S™, and TDM Data Formats
Enhanced Diminishing Manufacturing Sources
(DMS) Support
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Accepts 16-, 18-, 20-, and 24-Bit Two's
Complement PCM Audio Data
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Enhanced Product-Change Notification
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Standalone or Software-Controlled
Configuration Modes
(1)
Qualification Pedigree
Four High-Performance, Multi-Level,
Delta-Sigma Digital-to-Analog Converters
Four-Wire Serial Peripheral Interface (SPI™)
Port Provides Control Register Access in
Software Mode
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Differential Voltage Outputs
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Power Supplies: 5 V Analog, 3.3 V Digital
Power Dissipation
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Full-Scale Output (Differential): 6.15 VPP
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Supports Sampling Frequencies up to 216 kHz
Typical Dynamic Performance (24-Bit Data)
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203 mW typical with fs = 48 kHz
220 mW typical with fs = 96 kHz
236 mW typical with fs = 192 kHz
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Dynamic Range (A-Weighted): 118 dB
THD+N: –100 dB
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Power-Down Modes
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Linear Phase, 8× Oversampling Digital
Interpolation Filter
Small 48-Lead TQFP Package
Digital De-Emphasis Filters for 32-kHz,
44.1-kHz, and 48-kHz Sampling Rates
APPLICATIONS
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Digital Mixing Consoles
Soft Mute Function
Digital Audio Workstations
Digital Audio Effects Processors
Broadcast Studio Equipment
Surround-Sound Processors
High-End A/V Receivers
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All-Channel Mute via the MUTE Input Pin
Per-Channel Mute Available in Software
Mode
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Digital Attenuation (Software Mode Only)
Attenuation Range: 0 dB to –119.5 dB
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(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.