V62/07635-01XE

更新时间： 2024-11-04 12:47:19

品牌	Logo	应用领域
德州仪器 - TI		比较器放大器放大器电路光电二极管输出元件
页数	文件大小	规格书
14页	526K
描述
1.8 V, NANOPOWER, PUSH/PULL OUTPUT COMPARATORS

阅读下载

中文翻译

获取价格

技术参数
数据手册

如果您发现信息不准确，欢迎纠错

V62/07635-01XE 技术参数

是否Rohs认证：	符合	生命周期：	Obsolete
零件包装代码：	SOIC	包装说明：	GREEN, PLASTIC, MS-012AA, SOIC-8
针数：	8	Reach Compliance Code：	compliant
ECCN代码：	EAR99	HTS代码：	8542.39.00.01
风险等级：	5.8	Is Samacsys：	N
放大器类型：	COMPARATOR	最大平均偏置电流 (IIB)：	0.0016 µA
最大输入失调电压：	25000 µV	JESD-30 代码：	R-PDSO-G8
JESD-609代码：	e4	长度：	4.9 mm
湿度敏感等级：	1	功能数量：	1
端子数量：	8	最高工作温度：	125 °C
最低工作温度：	-55 °C	输出类型：	PUSH-PULL
封装主体材料：	PLASTIC/EPOXY	封装代码：	SOP
封装形状：	RECTANGULAR	封装形式：	SMALL OUTLINE
峰值回流温度（摄氏度）：	260	认证状态：	Not Qualified
标称响应时间：	1200 ns	座面最大高度：	1.75 mm
子类别：	Comparator	供电电压上限：	5.5 V
标称供电电压 (Vsup)：	5 V	表面贴装：	YES
温度等级：	MILITARY	端子面层：	Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：	GULL WING	端子节距：	1.27 mm
端子位置：	DUAL	处于峰值回流温度下的最长时间：	NOT SPECIFIED
宽度：	3.9 mm	Base Number Matches：	1

V62/07635-01XE 数据手册

TLV3491A-EP, TLV3492A-EP, TLV3494A-EP

www.ti.com

SGDS035–DECEMBER 2007

1.8 V, NANOPOWER,

PUSH/PULL OUTPUT COMPARATORS

FEATURES

APPLICATIONS

•

Portable Medical Equipment

Wireless Security Systems

Remote Control Systems

Handheld Instruments

•

Very Low Supply Current: 0.8 µA (Typical)

•

Input Common Mode Range 200 mV Beyond

Supply Rails

•

Supply Voltage: 1.8 V to 5.5 V

High Speed: 6 µs

Ultra-Low Power Systems

Push/Pull CMOS Output Stage

Controlled Baseline

DESCRIPTION/ORDERING INFORMATION

The TLV349x family of push/pull output comparators

features a fast 6µs response time and <1.2 µA (max)

nanopower capability, allowing operation from 1.8 V

to 5.5 V. Input common-mode range beyond supply

rails make the TLV349x an ideal choice for

low-voltage applications.

–

One Assembly/Test Site, One Fabrication

Site

•

Extended Temperature Performance of –55°C

to 125°C

Enhanced Diminishing Manufacturing Sources

(DMS) Support

The TLV349x is excellent for power-sensitive,

low-voltage (2-cell) applications.

•

Enhanced Product Change Notification

Qualification Pedigree

TLV349x RELATED PRODUCTS

Component qualification in accordance with JEDEC and industry

standards to ensure reliable operation over an extended

temperature range. This includes, but is not limited to, Highly

Accelerated Stress Test (HAST) or biased 85/85, temperature

cycle, autoclave or unbiased HAST, electromigration, bond

intermetallic life, and mold compound life. Such qualification testing

should not be viewed as justifying use of this component beyond

specified performance and environmental limits.

PRODUCT

FEATURES

550 nA, 2.5 V to 16 V, Push-Pull CMOS

Output Stage Comparator

TLV370x

550 nA, 2.5 V to 16 V, Open-Drain Output

Stage Comparator

TLV340x

ORDERING INFORMATION⁽¹⁾

SPECIFIED

PACKAGE

TEMPERATURE

MARKING

PACKAGE-

LEAD

PACKAGE

ORDERABLE

PART NUMBER

TRANSPORT MEDIA,

QUANTITY

PRODUCT

DESIGNATOR⁽²⁾

RANGE

TLV3491

TLV3492

TLV3494

SO-8

–55°C to 125°C

3491EP

3492EP

3494EP

TLV3491AMDREP⁽³⁾Tape and Reel, 2500

TLV3492AMDREP Tape and Reel, 2500

TLV3494AMDREP⁽³⁾Tape and Reel, 2500

SO-14

(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

(3) Prouct Preview. Contact your Texas Instruments Sales Representative for availability.

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

UNLESS OTHERWISE NOTED this document contains

PRODUCTION DATA information current as of publication date.

Products conform to specifications per the terms of Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.

12 3 4 5 6 7...14

中文翻译

下载PDF

与V62/07635-01XE相关器件

型号	品牌	获取价格	描述	数据表
V62/07635-02XE	TI	获取价格	增强型产品毫微功耗高速单路比较器 \| D \| 8 \| -55 to 125
V62/07636-01XE	TI	获取价格	LOW INPUT VOLTAGE, CAP FREE 150 mA LOW-DROPOUT (LDO) LINEAR REGULATOR
V62/07637-01XE	TI	获取价格	DUAL 2-INPUT POSITIVE-NOR GATE
V62/07638-01XE	TI	获取价格	CURRENT SHUNT MONITORSâ16 V to 80 V Common
V62/07642-01XE	TI	获取价格	High-Performance, 24 Bit, 216 kHz Sampling, Stereo Audio Analog-to-Digital Converte
V62/07643-01XE	TI	获取价格	High-Performance, 24-Bit, 216-kHz Sampling, Four-Channel Audio Digital-to-Analog Converter
V62/07644-01XA	TI	获取价格	Video/Imaging Fixed Point Digital Signal Processor
V62/07644-04XA	TI	获取价格	Video/Imaging Fixed Point Digital Signal Processor
V62/07645-01XE	TI	获取价格	SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUT
V62/07646-01XE	TI	获取价格	增强型产品双路差分比较器 \| D \| 8 \| -55 to 125

与V62/07635-01XE相关文章

英伟达新AI芯片Rubin或提前半年亮相
2024-11-05

13
苹果iPhone 17将全系采用三星/LG显示LTPO OLED面板
2024-11-05

7
三星深化印度制造布局，供应链本地化进程加速
2024-10-29

35
芯擎科技“星辰一号”自动驾驶芯片点亮成功，2025年量产在即
2024-10-29

31

产品中心

服务支持

精选活动

关于我们

帮助中心

V62/07635-01XE

V62/07635-01XE 技术参数

V62/07635-01XE 数据手册

与V62/07635-01XE相关器件

与V62/07635-01XE相关文章

您还可以找

产品中心

服务支持

精选活动

关于我们

帮助中心

V62/07635-01XE

V62/07635-01XE 技术参数

V62/07635-01XE 数据手册

与V62/07635-01XE相关器件

与V62/07635-01XE相关文章

您还可以找

您在本页遇到什么问题？